Atmel ARM-Based Evaluation Kit for SAM4S16C, 32-Bit ARM® Cortex® Microcontroller ATSAM4S-WPIR-RD ATSAM4S-WPIR-RD Data Sheet

SAM4S Series [DATASHEET]

Atmel-11100G-ATARM-SAM4S-Datasheet_27-May-14

1196

The errata are applicable to the devices in 

The Write Buffer in the embedded Flash is not cleared after trying to write to a locked region. Therefore, the data that 

was previously loaded into the Write Buffer would remain in the buffer while the next page write command (e.g. WP) is 

being executed.

Do not do partial programming (Fill completely the Write Buffer). Note that this problem occurs only if the software tries to 

write into a locked region.

The EFC does not work after the buffer for loop optimization is disabled, in Flash Mode Register (EEFC_FMR) CLOE = 

0. 

The CLOE bit must be kept at 1.

If one of sub-sector (Small Sector 0, Small Sector1 and Larger Sector)  is locked, the Erase Sector Command (ES) is not 

possible on non-locked sub-sectors.

All the lock bits of the sector0 must be cleared prior to issuing the ES command. After the ES command has been 

issued, the first sector lock bits must be reverted to the state before clearing them.

SAM4SD32C (Rev A)

0x29A7_0EE0

SAM4SD32B (Rev A)

0x2997_0EE0

SAM4SD16C (Rev A)

0x29A7_0CE0

SAM4SD16B (Rev A)

0x2997_0CE0

SAM4SA16C (Rev A)

0x28A7_0CE0

SAM4SA16B (Rev A)

0x2897_0CE0

SAM4S16C (Rev A)

0x28AC_0CE0

SAM4S16B (Rev A)

0x289C_0CE0

SAM4S8C (Rev A)

0x28AC_0AE0

SAM4S8B (Rev A)

0x289C_0AE0