Atmel ARM-Based Evaluation Kit for SAM4S16C, 32-Bit ARM® Cortex® Microcontroller ATSAM4S-WPIR-RD ATSAM4S-WPIR-RD Data Sheet
Product codes
ATSAM4S-WPIR-RD
SAM4S Series [DATASHEET]
Atmel-11100G-ATARM-SAM4S-Datasheet_27-May-14
372
21.3
Parallel Fast Flash Programming
21.3.1 Device Configuration
In Fast Flash Programming Mode, the device is in a specific test mode. Only a certain set of pins is significant. The
rest of the PIOs are used as inputs with a pull-up. The crystal oscillator is in bypass mode. Other pins must be left
unconnected.
Figure 21-1.
SAM4SxB/C Parallel Programming Interface
NCMD
PGMNCMD
RDY
PGMRDY
NOE
PGMNOE
NVALID
PGMNVALID
MODE[3:0]
PGMM[3:0]
DATA[15:0]
PGMD[15:0]
XIN
TST
VDDIO
PGMEN0
PGMEN1
0 - 50MHz
VDDIO
VDDCORE
VDDIO
VDDPLL
GND
VDDIO
Table 21-1.
Signal Description List
Signal Name
Function
Type
Active
Level
Comments
Power
VDDIO
I/O Lines Power Supply
Power
VDDCORE
Core Power Supply
Power
VDDPLL
PLL Power Supply
Power
GND
Ground
Ground
Clocks
XIN
Main Clock Input.
This input can be tied to GND. In this
This input can be tied to GND. In this
case, the device is clocked by the internal
RC oscillator.
Input
32 KHz to 50 MHz
Test
TST
Test Mode Select
Input
High
Must be connected to VDDIO
PGMEN0
Test Mode Select
Input
High
Must be connected to VDDIO
PGMEN1
Test Mode Select
Input
High
Must be connected to VDDIO
PGMEN2
Test Mode Select
Input
Low
Must be connected to GND