Atmel SAM4L-EK Atmel ATSAM4L-EK ATSAM4L-EK Data Sheet

42023E–SAM–07/2013

The implemented JTAG instructions are shown in the table below.

Implemented JTAG instructions list

b0000

EXTEST

Select boundary-scan chain as data register for 
testing circuitry external to 

the device.

yes

BSCAN-TAP

b0001

SAMPLE_PRELOAD

Take a snapshot of external pin values without 
affecting system operation.

yes

b0100

INTEST

Select boundary-scan chain for internal testing of the 
device.

yes

b0101

CLAMP

Bypass device through Bypass register, while driving 
outputs from boundary-scan register. 

yes

b1000

ABORT

ARM JTAG-DP Instruction

yes

SWJ-DP 

(in JTAG mode)

b1010

DPACC

ARM JTAG-DP Instruction

yes

b1011

APACC

ARM JTAG-DP Instruction

yes

b1100

-

Reserved

yes

b1101

-

Reserved

yes

b1110

IDCODE

ARM JTAG-DP Instruction

yes

b1111

BYPASS

Bypass this device through the bypass register.

yes