Agilent Technologies 8935 series e6380a Manuale Utente

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Chapter 6
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Analog Measurements - Screens and Control Fields
Control Fields for Analog Measurements
Scope To
This field selects the signal source for the oscilloscope. This allows you 
to bypass certain sections of the AF analyzer’s circuitry when viewing 
and measuring a signal. It also allows you to select measurement paths 
that include additional gain stages, improving the oscilloscope’s 
resolution when measuring low-level signals. 
Input
 looks at the unfiltered signal directly from the input.
Filters
 looks at the signal after filtering through Filter 1 and 
Filter 2.
De-Emp
 looks at the signal after filtering through Filter 1 and 
Filter 2, and after 750 
µ
s de-emphasis (if the 
De-emphasis
 field is 
set to 
750 us
.)
Notch
 looks at the signal after filtering through Filter 1 and Filter 2, 
after de-emphasis (if used), and after the notch filter.
Screens on which this field is displayed
AF ANALYZER
Sensitivity (RF analyzer)
RF analyzer sensitivity adds about 6 dB of sensitivity for the ANT IN 
port when 
High
 is selected and the 
Input Atten
 field is set to 0 dB. 
Operating Considerations
Selecting 
High
 sensitivity may cause spectrum analyzer measurements 
to be uncalibrated when the ANT IN port is used (a message appears 
when this occurs).
High-level AM measurements may be distorted when high sensitivity is 
used with the ANT IN port. 
Screens on which this field is displayed
RF ANALYZER