Agilent Technologies 8935 series e6380a Manuale Utente
214
Chapter 6
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Analog Measurements - Screens and Control Fields
Control Fields for Analog Measurements
Scope To
This field selects the signal source for the oscilloscope. This allows you
to bypass certain sections of the AF analyzer’s circuitry when viewing
and measuring a signal. It also allows you to select measurement paths
that include additional gain stages, improving the oscilloscope’s
resolution when measuring low-level signals.
to bypass certain sections of the AF analyzer’s circuitry when viewing
and measuring a signal. It also allows you to select measurement paths
that include additional gain stages, improving the oscilloscope’s
resolution when measuring low-level signals.
•
Input
looks at the unfiltered signal directly from the input.
•
Filters
looks at the signal after filtering through Filter 1 and
Filter 2.
•
De-Emp
looks at the signal after filtering through Filter 1 and
Filter 2, and after 750
µ
s de-emphasis (if the
De-emphasis
field is
set to
750 us
.)
•
Notch
looks at the signal after filtering through Filter 1 and Filter 2,
after de-emphasis (if used), and after the notch filter.
Screens on which this field is displayed
AF ANALYZER
Sensitivity (RF analyzer)
RF analyzer sensitivity adds about 6 dB of sensitivity for the ANT IN
port when
port when
High
is selected and the
Input Atten
field is set to 0 dB.
Operating Considerations
Selecting
High
sensitivity may cause spectrum analyzer measurements
to be uncalibrated when the ANT IN port is used (a message appears
when this occurs).
when this occurs).
High-level AM measurements may be distorted when high sensitivity is
used with the ANT IN port.
used with the ANT IN port.
Screens on which this field is displayed
RF ANALYZER