Epson ARM720T Benutzerhandbuch

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9: Debugging Your System
9-22
EPSON
ARM720T CORE CPU MANUAL
9.14
Test data registers
The six test data registers that can connect between DBGTDI and DBGTDO are described in 
the following sections: 
In the following descriptions, data is shifted during every HCLK cycle when DBGTCKEN 
enable is HIGH.
9.14.1
Bypass register
Purpose
Bypasses the device during scan testing by providing a path 
between DBGTDI and DBGTDO.
Length
1 bit.
Operating mode
When the BYPASS instruction is the current instruction in the 
instruction register, serial data is transferred from DBGTDI to 
DBGTDO in the SHIFT-DR state with a delay of one HCLK cycle 
enabled by DBGTCKEN.
There is no parallel output from the bypass register.
A logic 0 is loaded from the parallel input of the bypass register in 
the CAPTURE-DR state.
9.14.2
ARM720T processor device identification (ID) code register
Purpose
Reads the 32-bit device identification code. No programmable 
supplementary identification code is provided.
Length
32 bits. The format of the ID code register is as shown in 
Figure 9-9  ID code register format
The default device identification code is 0x7f1f0f0f.
Operating mode
When the IDCODE instruction is current, the ID register is 
selected as the serial path between DBGTDI and DBGTDO.
There is no parallel output from the ID register.
The 32-bit device identification code is loaded into the ID register 
from its parallel inputs during the CAPTURE-DR state.
0
1
11
12
27
28
31
Version
Part number
Manufacturer identity
1