Texas Instruments RM46 Hercules Safety MCU controlCARD TMDXRM46CNCD TMDXRM46CNCD Datenbogen
Produktcode
TMDXRM46CNCD
SPNS184A – SEPTEMBER 2012 – REVISED SEPTEMBER 2013
4.6.3
Clock Test Mode
The RM4x platform architecture defines a special mode that allows various clock signals to be brought out
on to the ECLK pin and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is very
useful for debugging purposes and can be configured via the CLKTEST register in the system module.
on to the ECLK pin and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is very
useful for debugging purposes and can be configured via the CLKTEST register in the system module.
Table 4-15. Clock Test Mode Options
SEL_ECP_PIN
SEL_GIO_PIN
=
SIGNAL ON ECLK
=
SIGNAL ON N2HET1[12]
CLKTEST[3-0]
CLKTEST[11-8]
0000
Oscillator
0000
Oscillator Valid Status
0001
Main PLL free-running clock output
0001
Main PLL Valid status
0010
Reserved
0010
Reserved
0011
EXTCLKIN1
0011
Reserved
0100
LFLPO
0100
Reserved
0101
HFLPO
0101
HFLPO Valid status
0110
Secondary PLL free-running clock output
0110
Secondary PLL Valid Status
0111
EXTCLKIN2
0111
Reserved
1000
GCLK
1000
LFLPO
1001
RTI Base
1001
Oscillator Valid status
1010
Reserved
1010
Oscillator Valid status
1011
VCLKA1
1011
Oscillator Valid status
1100
Reserved
1100
Oscillator Valid status
1101
VCLKA3_DIVR
1101
VCLKA3_S
1110
VCLKA4_DIVR
1110
VCLKA4_S
1111
Reserved
1111
Oscillator Valid status
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System Information and Electrical Specifications
73
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