Texas Instruments DAC3282EVM - DAC3282 Evaluation Module DAC3282EVM DAC3282EVM Datenbogen
Produktcode
DAC3282EVM
Basic Test Procedure
www.ti.com
Figure 2. DAC3282 GUI Front Panel
3
Basic Test Procedure
This section outlines the basic test procedure for testing the EVM.
3.1
Test Block Diagram
The test setup for general testing of the DAC328x with the TSW3100 pattern generation card is shown in
4
DAC3282
SLAU304C – February 2010 – Revised November 2010
Copyright © 2010, Texas Instruments Incorporated