Texas Instruments F28M36 Concerto Control Card TMDSCNCD28M36 TMDSCNCD28M36 Datenbogen
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Produktcode
TMDSCNCD28M36
SPRS825C – OCTOBER 2012 – REVISED FEBRUARY 2014
2
Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
This data sheet revision history highlights the technical changes made to the SPRS825B device-specific
data sheet to make it an SPRS825C revision.
data sheet to make it an SPRS825C revision.
Scope:
F28M36x devices are now available in the Q temperature range (–40°C to 125°C, Q100 qualification for automotive
applications). See
applications). See
Added
, Related Links, which provides quick access to available resources.
See the following table.
LOCATION
ADDITIONS, DELETIONS, AND MODIFICATIONS
Global
•
F28M36x devices are now available in the Q temperature range (–40°C to 125°C, Q100 qualification
for automotive applications). See
for automotive applications). See
.
•
Changed description of 289-ball ZWT package from "Plastic Ball Grid Array (PBGA)" to "New Fine
Pitch Ball Grid Array (nFBGA)"
Pitch Ball Grid Array (nFBGA)"
Changed title from "F28M36x (Concerto) MCUs" to "Device Summary"
Device Summary:
•
Changed "Cortex™-M3 Core Hardware Logic Built-in Self Test" to "Cortex-M3 Core Hardware Built-in
Self-Test"
Self-Test"
•
Changed "C28x Core Hardware Logic Built-in Self Test" to "C28x Core Hardware Built-in Self-Test"
Description:
•
Added "Device Information" table
Hardware Features:
•
Updated "The maximum frequency at which the Cortex-M3 core can run ..." footnote
Added "Possible Speed Combinations for Cortex-M3 and C28x Cores" table
Changed title from "C28x™ Core Hardware Logic Built-In Test (LBIST)" to "C28x Core Hardware Built-In
Self-Test"
Self-Test"
C28x Core Hardware Built-In Self-Test:
•
Changed "Logic Built-In Self Test (LBIST)" to "Hardware Built-In Self-Test (HWBIST)"
•
Changed LBIST to HWBIST
C28x Normal Mode:
•
Removed reference to the HISPCP register
Updated "C28x Clocks and Low-Power Modes" figure
Terminal Functions:
•
XCLKOUT: Updated DESCRIPTION. Changed XCLKCFG to XPLLCLKCFG.
Added "Handling Ratings" section
Added "Crystal Equivalent Series Resistance (ESR) Requirements" table
Power Management and Supervisory Circuit Solutions:
•
Removed TPS75005
Added "Master Subsystem – Flash Data Retention Duration" table
Added "Control Subsystem – Flash Data Retention Duration" table
Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements:
•
Added footnote that references
C28x Serial Communications Interface (SCI):
•
Updated list of SCI module features:
–
–
Changed "4-level transmit and receive FIFO" to "16-level transmit and receive FIFO"
Device and Documentation Support:
•
Added
, Related Links
•
Added "Trademarks" section
•
Added "Electrostatic Discharge Caution" section
•
Added "Glossary" section
Copyright © 2012–2014, Texas Instruments Incorporated
Revision History
5
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