Texas Instruments CC2650DK Benutzerhandbuch
Customer Configuration (CCFG)
9.1
Customer Configuration (CCFG)
•
Image valid bit (normally set by the programming tool)
•
Failure analysis access configuration
•
Custom MAC address
•
Bootloader configuration
•
TAP and DAP access configuration
In TI distributed software, the CCFG parameters are set at compile time in the ccfg.c file. The CCFG
settings are set by default to allow full debugging of the device. The CCFG settings are not recommended
for production.
settings are set by default to allow full debugging of the device. The CCFG settings are not recommended
for production.
The recommended way to configure a device for final production is as follows:
1. The [BL_CONFIG:BOOTLOADER_ENABLE] register and the [BL_CONFIG:BL_ENABLE] register must
be set to 0x00 to disallow access to Flash contents through the bootloader interface.
2. The [CCFG_TI_OPTIONS:TI_FA_ENABLE] register must be set to 0x00 to disallow failure analysis
access by TI.
3. The [CCFG_TAP_DAP_0:PRCM_TAP_ENABLE] register, the
[CCFG_TAP_DAP_0:TEST_TAP_ENABLE] register, and the
[CCFG_TAP_DAP_0:CPU_DAP_ENABLE] register must be set to set to 0x00 to disallow access to
these module through JTAG.
[CCFG_TAP_DAP_0:CPU_DAP_ENABLE] register must be set to set to 0x00 to disallow access to
these module through JTAG.
4. The [CCFG_TAP_DAP_1] register must be set to 0x0000 0000 to disallow access to these modules
through JTAG.
5. The [IMAGE_VALID_CONF:IMAGE_VALID] register must be set to 0x0000 0000 to pass control to the
programmed image in Flash at boot.
6. Optionally, the [ERASE_CONF:CHIP_ERASE_DIS_N] register can be set to 0x0 to disallow erasing of
the Flash.
7. Use the [CCFG_PROT_*] registers to write and erase protect the sectors of Flash that are not
designed to be updated in-system by the final product.
NOTE:
Enabling some of the functionality in the ENABLE fields in CCFG are contingent on the
corresponding ENABLE field in FCFG that has been set to enabled by the TI production test.
This is the case for the [CCFG_TAP_DAP_0:TEST_TAP_ENABLE] register for example,
which is enabled in FCFG in some products in the family while it is not enabled in others. In
the products where the [CCFG_TAP_DAP_0:TEST_TAP_ENABLE] register is not enabled in
FCFG, the value in the corresponding CCFG field is ignored and the functionality is disabled.
This is the case for the [CCFG_TAP_DAP_0:TEST_TAP_ENABLE] register for example,
which is enabled in FCFG in some products in the family while it is not enabled in others. In
the products where the [CCFG_TAP_DAP_0:TEST_TAP_ENABLE] register is not enabled in
FCFG, the value in the corresponding CCFG field is ignored and the functionality is disabled.
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Device Configuration
SWCU117A – February 2015 – Revised March 2015
Copyright © 2015, Texas Instruments Incorporated