Texas Instruments CC2650DK Benutzerhandbuch
Factory Configuration (FCFG)
9.2.1.28 FLASH_C_E_P_R Register (Offset = 174h) [reset = X]
FLASH_C_E_P_R is shown in
and described in
Flash Compaction, Execute, Program and Read
Figure 9-49. FLASH_C_E_P_R Register
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
RVSU
PV_ACCESS
R-Ah
R-Ah
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
A_EXEZ_SETUP
CVSU
R-2h
R-X
Table 9-51. FLASH_C_E_P_R Register Field Descriptions
Bit
Field
Type
Reset
Description
31-24
RVSU
R
Ah
Repeat verify setup time in cycles. Used for repeated verifies during
program and erase. Value will be written to
FLASH:FSM_EX_VAL.REP_VSU by the flash device driver when an
erase/program operation is initiated.
program and erase. Value will be written to
FLASH:FSM_EX_VAL.REP_VSU by the flash device driver when an
erase/program operation is initiated.
23-16
PV_ACCESS
R
Ah
Program verify EXECUTEZ->data valid time in half-microseconds.
Value will be converted to number of FCLK cycles by by flash device
driver and the converted value is written to
FLASH:FSM_EX_VAL.EXE_VALD when an erase/program
operation is initiated..
Value will be converted to number of FCLK cycles by by flash device
driver and the converted value is written to
FLASH:FSM_EX_VAL.EXE_VALD when an erase/program
operation is initiated..
15-12
A_EXEZ_SETUP
R
2h
Address->EXECUTEZ setup time in cycles. Value will be written to
FLASH:FSM_CMP_VSU.ADD_EXZ by the flash device driver when
an erase/program operation is initiated..
FLASH:FSM_CMP_VSU.ADD_EXZ by the flash device driver when
an erase/program operation is initiated..
11-0
CVSU
R
X
Compaction verify setup time in cycles.
743
SWCU117A – February 2015 – Revised March 2015
Device Configuration
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