Texas Instruments DP130 Single-Source Evaluation Module DP130SSEVM DP130SSEVM Datenbogen
Produktcode
DP130SSEVM
SLLSE57D – APRIL 2011 – REVISED JULY 2013
REVISION HISTORY
Changes from Original (April 2011) to Revision A
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Changed pin numbers in PIN FUNCTIONS table, VDDD_DREG and NC ...........................................................................
Changes from Revision A (September 2011) to Revision B
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Deleted pins 37 an 43 from GND in the PIN FUNCTIONS table .........................................................................................
Changes from Revision B (October 2011) to Revision C
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Deleted unnecessary tie dots in
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Deleted unnecessary tie dot in Block Diagram .....................................................................................................................
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Added text to RSTN description in PIN FUNCTIONS ..........................................................................................................
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Added DP130 POWER SEQUENCING section ...................................................................................................................
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Added rows to Device power under normal operation in POWER DISSIPATION table ....................................................
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Added RSTN pin row to V
IH
in RECOMMENDED OPERATING CONDITIONS ................................................................
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Added RSTN pin row to V
IL
in RECOMMENDED OPERATING CONDITIONS .................................................................
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Changed in Table 1 13.9 to 113.9 ......................................................................................................................................
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Changed
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Changed
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Changed
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Changed
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Changes from Revision C (January 2013) to Revision D
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Power-Up Sequence deleted: 1. Assert RSTN and de-assert EN to the device. .................................................................
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Power-Up Sequence deleted: 5. Assert EN a minimum of 10 µs after RSTN has been de-asserted. ................................
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Power-Down Sequence deleted: 1. De-assert EN to the device ..........................................................................................
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Deleted the EN time line from
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