Texas Instruments DAC3164 Evaluation Module DAC3164EVM DAC3164EVM Datenbogen

Produktcode

DAC3164EVM

Basic Test Procedure with TSW1400

Basic Test Procedure with TSW1400

This section outlines the basic test procedure for testing the EVM.

3.1

Test Block Diagram

The test set-up for general testing of the DAC31x4 with the TSW1400 pattern generation card is shown in

Figure 6. Test Setup Block Diagram

3.2

Test Set-up Connection

•

TSW1400 Pattern Generator

1. Connect the 5-V power supply to J12, the 5V_IN jack of the TSW1400 EVM.

2. Connect the PC’s USB port to J5, the mini-USB port of the TSW1400.

•

DAC31x4 EVM

1. Connect the J13 connector of DAC31x4 EVM to the J4 connector of TSW1400 EVM.

2. Connect 6 V to J3, the power in jack of the DAC31x4 EVM.

3. Connect the PC’s USB port to J2, the USB port of the DAC31x4 EVM. Use a standard A to mini-B

connector cable.

4. Provide a 1.5-Vrms, 500-MHz max clock at J9, the CLKIN SMA port of the DAC31x4 EVM.

5. Provide 12-dBm maximum, 300-MHz to 4-GHz LO source at the J13 port of the DAC31x4 EVM.

This provides the LO source to the TRF3705-15 modulators.

6. Connect the RF output port of J15 to the spectrum analyzer.

SLAU466A – November 2012 – Revised June 2013

DAC31x4 EVM User's Guide