Texas Instruments DAC3164 Evaluation Module DAC3164EVM DAC3164EVM Fiche De Données
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DAC3164EVM
Basic Test Procedure with TSW1400
3
Basic Test Procedure with TSW1400
This section outlines the basic test procedure for testing the EVM.
3.1
Test Block Diagram
The test set-up for general testing of the DAC31x4 with the TSW1400 pattern generation card is shown in
Figure 6. Test Setup Block Diagram
3.2
Test Set-up Connection
•
TSW1400 Pattern Generator
1. Connect the 5-V power supply to J12, the 5V_IN jack of the TSW1400 EVM.
2. Connect the PC’s USB port to J5, the mini-USB port of the TSW1400.
•
DAC31x4 EVM
1. Connect the J13 connector of DAC31x4 EVM to the J4 connector of TSW1400 EVM.
2. Connect 6 V to J3, the power in jack of the DAC31x4 EVM.
3. Connect the PC’s USB port to J2, the USB port of the DAC31x4 EVM. Use a standard A to mini-B
connector cable.
4. Provide a 1.5-Vrms, 500-MHz max clock at J9, the CLKIN SMA port of the DAC31x4 EVM.
5. Provide 12-dBm maximum, 300-MHz to 4-GHz LO source at the J13 port of the DAC31x4 EVM.
This provides the LO source to the TRF3705-15 modulators.
6. Connect the RF output port of J15 to the spectrum analyzer.
7
SLAU466A – November 2012 – Revised June 2013
DAC31x4 EVM User's Guide
Copyright © 2012–2013, Texas Instruments Incorporated