Freescale Semiconductor KIT912F634EVME Evaluation Kit KIT912F634EVME KIT912F634EVME Datenbogen

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KIT912F634EVME
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Electrical Characteristics 
Dynamic Electrical Characteristics 
MM912F634
Freescale Semiconductor
30
3.6.2.3
Reset, Oscillator and Internal Clock Generation
3.6.2.3.1
Startup & FLL Characteristics
 summarizes several startup characteristics explained in this section. Detailed description of the startup behavior can be 
found in the Clock and Reset Generator (CRG) block description.
Table 39. Startup & FLL Characteristics
Rating
Symbol
Min
Typ
Max
Unit
Internal Reference Frequency
C  T
J
 
 105 C)
f
IREF_TRIM
31.36
32
32.64
kHz
Internal Reference Frequency
C  T
J
 
 140 C)
f
IREF_TRIM
30.40
32
33.60
kHz
Allowed frequency range for FLL Reference Clock
f
FLLREF
25.52
-
40
kHz
DCO Frequency locking range
f
DCO
32
-
40
MHz
DCO minimum frequency
f
DCO_MIN
18
-
29
MHz
DCO stabilization delay in frequency locked loop
t
STAB
-
0.3
-
ms
Lock Detection
LOCK
 |
0
-
1.5
%
Un-lock Detection
UNLOCCK
 |
0.5
-
2.5
%
DCO quantization error
t
DCO
-
-
0.2
%t
DCO
STOP recovery time
(Internal Reference Clock trimmed to 32 kHz)
t
STP_REC
-
20
-
s
Oscillator Monitor Failure Assert Frequency
f
OMFA
50
-
200
kHz
Reset input pulse width, minimum input time
PW
RSTL
2.0
-
-
t
DCO_MIN
Startup from Reset
n
RST
772
-
773
t
DCO_MIN
Note:
48. Reference Frequency is factory trimmed
49. % deviation from target frequency, target frequency is f
IREF_TRIM
 * (1000 + 2*MULT[6:0])
50. f
DCO =
40 MHz, f
IREF_TRIM =
32 kHz, MULT = $7D