Aethra d2000pro User Guide
Quick Guide
VX2000
10
GB
•
NO, the device guarantees and controls the C108, C107, C105, C106 and C109i
criteria
criteria
•
YES, the management and the check of these criteria, between DTE and DCE, is
disabled
disabled
Clock RX: Define the type of clock used to receive data; with CLOCK RX:
LOOPED, the device samples data received with the clock coming from DTE
(C113). Only DCE.
LOOPED, the device samples data received with the clock coming from DTE
(C113). Only DCE.
In DCE mode, the clock TX is fixed at “INSIDE”, whereas in DTE
mode, the device uses the clock coming from the DCE over
C114 criterion.
mode, the device uses the clock coming from the DCE over
C114 criterion.
Loop3 (C141): Set “YES” to ask the DCE to perform a local loop (LL) of the data.
Only DTE.
Only DTE.
The LL (local loop) request is supported by V.35 and V.36
interfaces only.
interfaces only.
1.3 UNFRAMED BER Test
In order to run a line quality test, select from the manual test menu, the
UNFRAMED BER and set the following parameters:
UNFRAMED BER and set the following parameters:
Duration: Choose the duration of the test. Select from the defined list or define your
own duration
Pass/Fail test: Choose the BER value. This value is used to determine the pass or
fail test condition. Selecting G.821, the result is compared with the quality
performance required by G.821. Only for line rate 64Kbit/s.
Error injection: Choose the BER value used for manual or automatic bit error
injection
Bit sequence: Set the pseudo-random pattern to be used. Select from the list
own duration
Pass/Fail test: Choose the BER value. This value is used to determine the pass or
fail test condition. Selecting G.821, the result is compared with the quality
performance required by G.821. Only for line rate 64Kbit/s.
Error injection: Choose the BER value used for manual or automatic bit error
injection
Bit sequence: Set the pseudo-random pattern to be used. Select from the list