Intel E7520 AT80604004887AA User Manual

Product codes
AT80604004887AA
Page of 172
Intel® Xeon® Processor 7500 Datasheet, Volume 1
35
Electrical Specifications
2.5.2.2
Requirements for 4.8 GT/s and 6.4 GT/s
Electrical specifications for Tx and Rx for 4.8 GT/s are captured in 
 and for 
6.4 GT/s are captured in 
.
Table 2-13. Parameter Values for Intel® QPI Channel at 4.8 GT/s  (Sheet 1 of 2)
Symbol
Parameter
Min
Nom
Max
Unit
Notes
V
Tx-diff-pp-pin
Transmitter differential swing
800
1500
mV
1
Z
TX_LOW_CM_DC
DC resistance of Tx terminations 
at half the single ended swing 
(which is usually 0.25*V
Tx-diff-pp-
pin
) bias point
38
47
Ω
Z
RX_LOW_CM_DC
DC resistance of Rx terminations 
at half the single ended swing 
(which is usually 0.25*V
Tx-diff-pp-
pin
) bias point
38
47
Ω
V
Tx-cm-dc-pin
Transmitter output DC common 
mode, defined as average of V
D+
 
and V
D-
0.23
0.27
Fraction of 
V
Tx-diff-pp-pin
V
Tx-cm-ac-pin
Transmitter output AC common 
mode, defined as ((V
D+
 + V
D-
)/2 - 
V
Tx-cm-dc-pin
)
-
0.0375
0.0375
Fraction of 
V
Tx-diff-pp-pin
2
TX
duty-pin
Average of UI-UI jitter.
-0.025
0.03
UI
TX
jitUI-UI-1E-7-pin
UI-UI jitter measured at Tx output 
pins with 1E-7 probability.
-0.065
0.07
UI
3
TX
jitUI-UI-1E-9-pin
UI-UI jitter measured at Tx output 
pins with 1E-9 probability.
-0.07
0.076
UI
TX
clk-acc-jit-N_UI-1E-7
p-p accumulated jitter out of 
transmitter over 0 <= n <= N UI 
where N=12, measured with 1E-7 
probability.
0
0.15
UI
TX
clk-acc-jit-N_UI-1E-9
p-p accumulated jitter out of 
transmitter over 0 <= n <= N UI 
where N=12, measured with 1E-9 
probability.
0
0.17
UI
T
Tx-data-clk-skew-pin
Delay of any data lane relative to 
clock lane, as measured at Tx 
output
-0.5
0.5
UI
V
Rx-diff-pp-pin
Voltage eye opening at the end of 
Tx+ channel for any data or clock 
channel measured with a 
cumulative probability of 1E-9 
(UI). 
225
1200
mV
T
Rx-diff-pp-pin
Timing eye opening at the end of 
Tx+ channel for any data or clock 
channel measured with a 
cumulative probability of 1E-9 (UI)
0.63
1
UI
T
Rx-data-clk-skew-pin
Delay of any data lane relative to 
the clock lane, as measured at the 
end of Tx+ channel. This 
parameter is a collective sum of 
effects of data clock mismatches 
in Tx and on the medium 
connecting Tx and Rx.
-1
4
UI