Nokia 9110 Service Manual
PAMS
Technical Documentation
RAE–2
BS1
Page 5 – 30
Section 02/99
Testpoints
Testpoints are located around the PDA PCB. They include clock, control,
data signals and voltages which is used for R&D, fault finding and testing
purposes.
data signals and voltages which is used for R&D, fault finding and testing
purposes.
Figure 6.
Testpoints layout
Table 16. Testpoints
Point
I/O
Name
Function
Min
Nom
Max
Unit
Description /
Note
Note
J310
LID_SWITCH_IF
Lid switch state
2.75
2.8
2.85
VDC
High, lid open
0
VDC
Low, lid closed
J400
33MHz
CPU core clock
2.3
2.80
2.85
VDC
High
0
0.45
VDC
Low
J401
O
X32_CLK
CMT sleep clock
2.3
2.80
2.85
VDC
High
0
0.45
VDC
Low
J402
I
VBB
CMT baseband voltage
2.7
2.80
2.85
VDC
High
1.0
mA
Maximum cur-
rent
rent