Fujifilm Xeon 5050 S26361-F3248-L300 Data Sheet
Product codes
S26361-F3248-L300
Electrical Specifications
32
Dual-Core Intel® Xeon® Processor 5000 Series Datasheet
maximum allowable overshoot above VID). These specifications apply to the processor
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
die voltage as measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands and
across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands.
Notes:
1.
V
OS
is the measured overshoot voltage above VID.
2.
T
OS
is the measured time duration above VID.
2.12.2
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
are < 10 ns in duration may be ignored. These measurement of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
Table 2-17. V
CC
Overshoot Specifications
Symbol
Parameter
Min
Max
Units
Figure
Notes
V
OS_MAX
Magnitude of V
CC
overshoot above VID
50
mV
T
OS_MAX
Time duration of V
CC
overshoot above VID
25
µs
Figure 2-5. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0
5
10
15
20
25
Time [us]
Voltage
[
V
]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID