Microchip Technology DV164136 Data Sheet

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© 2008 Microchip Technology Inc.
DS39646C-page 393
PIC18F8722 FAMILY
TABLE 28-1:
MEMORY PROGRAMMING REQUIREMENTS    
 
     
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C 
≤ T
A
 
≤ +85°C for industrial 
Param
No.
Sym
Characteristic
Min
Typ†
Max
Units
Conditions
Data EEPROM Memory
D120
E
D
Byte Endurance
100K
1M
E/W
-40
°C to +85°C
D121
V
DRW
V
DD
 for Read/Write
V
MIN
5.5
V
Using EECON to read/write
V
MIN
 = Minimum operating 
voltage
D122
T
DEW
Erase/Write Cycle Time
4
ms
D123
T
RETD
Characteristic Retention
40
Year Provided no other 
specifications are violated
D124
T
REF
Number of Total Erase/Write 
Cycles before Refresh
(1)
1M
10M
E/W
-40°C to +85°C 
D125
I
DDP
Supply Current during 
Programming
10
mA
Program Flash Memory
D130
E
P
Cell Endurance
10K
100K
E/W
-40
°C to +85°C
D131
V
PR
V
DD
 for Read
V
MIN
5.5
V
V
MIN
 = Minimum operating 
voltage
D132B V
PEW
V
DD
 for Self-Timed Write and 
Row Erase
V
MIN
5.5
V
V
MIN
 = Minimum operating 
voltage
D133A T
IW
Self-Timed Write Cycle Time
2
ms
D134
T
RETD
Characteristic Retention
40
100
Year Provided no other 
specifications are violated
D135
I
DDP
Supply Current during 
Programming
10
mA
† Data in “Typ” column is at 5.0V, 25°C unless otherwise stated. These parameters are for design guidance 
only and are not tested.
Note 1:
Refer to Section 8.8 “Using the Data EEPROM” for a more detailed discussion on data EEPROM 
endurance.