Microchip Technology DV164136 Data Sheet
© 2008 Microchip Technology Inc.
DS39646C-page 393
PIC18F8722 FAMILY
TABLE 28-1:
MEMORY PROGRAMMING REQUIREMENTS
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C
Operating temperature -40°C
≤ T
A
≤ +85°C for industrial
Param
No.
Sym
Characteristic
Min
Typ†
Max
Units
Conditions
Data EEPROM Memory
D120
E
D
Byte Endurance
100K
1M
—
E/W
-40
°C to +85°C
D121
V
DRW
V
DD
for Read/Write
V
MIN
—
5.5
V
Using EECON to read/write
V
V
MIN
= Minimum operating
voltage
D122
T
DEW
Erase/Write Cycle Time
—
4
—
ms
D123
T
RETD
Characteristic Retention
40
—
—
Year Provided no other
specifications are violated
D124
T
REF
Number of Total Erase/Write
Cycles before Refresh
Cycles before Refresh
(1)
1M
10M
—
E/W
-40°C to +85°C
D125
I
DDP
Supply Current during
Programming
Programming
—
10
—
mA
Program Flash Memory
D130
E
P
Cell Endurance
10K
100K
—
E/W
-40
°C to +85°C
D131
V
PR
V
DD
for Read
V
MIN
—
5.5
V
V
MIN
= Minimum operating
voltage
D132B V
PEW
V
DD
for Self-Timed Write and
Row Erase
V
MIN
—
5.5
V
V
MIN
= Minimum operating
voltage
D133A T
IW
Self-Timed Write Cycle Time
—
2
—
ms
D134
T
RETD
Characteristic Retention
40
100
—
Year Provided no other
specifications are violated
D135
I
DDP
Supply Current during
Programming
Programming
—
10
—
mA
† Data in “Typ” column is at 5.0V, 25°C unless otherwise stated. These parameters are for design guidance
only and are not tested.
Note 1:
Refer to Section 8.8 “Using the Data EEPROM” for a more detailed discussion on data EEPROM
endurance.
endurance.