Atmel Xplained Pro Evaluation Kit ATSAM4E-XPRO ATSAM4E-XPRO Data Sheet
Product codes
ATSAM4E-XPRO
SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
304
Figure 13-3.
Application Test Environment Example
13.5
Debug and Test Pin Description
Chip 2
Chip n
Chip 1
SAM4
SAM4-based Application Board In Test
JTAG
Connector
Tester
Test Adaptor
JTAG
Probe
Table 13-1.
Debug and Test Signal List
Signal Name
Function
Type
Active Level
Reset/Test
NRST
Microcontroller Reset
Input/Output
Low
TST
Test Select
Input
SWD/JTAG
TCK/SWCLK
Test Clock/Serial Wire Clock
Input
TDI
Test Data In
Input
TDO/TRACESWO
Test Data Out/Trace
Asynchronous Data Out
Asynchronous Data Out
Output
TMS/SWDIO
Test Mode Select/Serial Wire
Input/Output
Input/Output
Input
JTAGSEL
JTAG Selection
Input
High