Intel Atom Processor N270 AU80586GE025D Data Sheet

Product codes
AU80586GE025D
Page of 57
 
Electrical Specifications 
 
 
Datasheet  
 25 
Signal Group 
Type 
Signals1 
Open Drain Output 
Synchronous 
to TCK 
TDO 
FSB Clock 
Clock 
BCLK [1:0] 
Power/Other  
COMP [3:0], HFPLL (old name is DBR#2), CMREF, 
GTLREF, TEST2/Dclk, TEST1/Aclk, THERMDA, 
THERMDC, VCC, VCCA, VCCP, VCC_SENSE, VSS, 
VSS_SENSE, VCCQ [1:0], VCCPC6 
NOTES:  
1. 
4 for signal descriptions and termination requirements. 
2. 
In processor systems where there is no debug port implemented on the system board, 
these signals are used to support a debug port interposer. In systems with the debug 
port implemented on the system board, these signals are no connects. 
3. 
PROCHOT# signal type is open drain output and CMOS input. 
3.8 
CMOS Asynchronous Signals 
CMOS input signals are shown in Table 5. Legacy output FERR#, IERR# and other 
non- AGTL+ signals (THERMTRIP# and PROCHOT#) use Open Drain output buffers. 
These signals do not have setup or hold time specifications in relation to BCLK [1:0]. 
However, all of the CMOS signals are required to be asserted for more than 5 BCLKs 
for the processor to recognize them. See Section 
3.10 for the DC specifications for the 
CMOS signal groups. 
3.9 
Maximum Ratings 
Table 6 specifies absolute maximum and minimum ratings. Within functional operation 
limits, functionality and long-term reliability can be expected. 
At conditions outside functional operation condition limits, but within absolute 
maximum and minimum ratings, neither functionality nor long term reliability can be 
expected. If a device is returned to conditions within functional operation limits after 
having been subjected to conditions outside these limits, but within the absolute 
maximum and minimum ratings, the device may be functional, but with its lifetime 
degraded depending on exposure to conditions exceeding the functional operation 
condition limits. 
At conditions exceeding absolute maximum and minimum ratings, neither functionality 
nor long term reliability can be expected. Moreover, if a device is subjected to these 
conditions for any length of time then, when returned to conditions within the 
functional operating condition limits, it will either not function or its reliability will be 
severely degraded.  
Although the processor contains protective circuitry to resist damage from static 
electric discharge, precautions should always be taken to avoid high static voltages or 
electric fields.