Cypress STK14C88-3 Manual De Usuario
STK14C88-3
Document Number: 001-50592 Rev. **
Page 8 of 17
Data Retention and Endurance
Parameter
Description
Min
Unit
DATA
R
Data Retention
100
Years
NV
C
Nonvolatile STORE Operations
1,000
K
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
Test Conditions
Max
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1 MHz,
V
CC
= 0 to 3.0 V
5
pF
C
OUT
Output Capacitance
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Parameter
Description
Test Conditions
32-SOIC
32-PDIP
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
procedures for measuring thermal impedance, per
EIA / JESD51.
TBD
TBD
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
(Junction to Case)
TBD
TBD
°C/W
Figure 6. AC Test Loads
AC Test Conditions
3.3V
Output
30 pF
R1 317
Ω
R2
351
Ω
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
8. These parameters are guaranteed by design and are not tested.