Cypress CY62138CV30 Manual De Usuario

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Document #: 001-08029 Rev. *E
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CY62138FV30 MoBL
®
Thermal Resistance 
Parameter
Description
Test Conditions
SOIC
VFBGA
TSOP II
STSOP
TSOP I Unit
Θ
JA
Thermal Resistance 
(Junction to Ambient)
Still air, soldered on a 3 x 4.5 
inch, two layer printed circuit 
board
44.53
38.49
44.16
59.72
50.19
°C/W
Θ
JC
Thermal Resistance 
(Junction to Case)
24.05
17.66
11.97
15.38
14.59
°C/W
AC Test Loads and Waveforms
 
Parameters
2.5V (2.2V to 2.7V)
 3.0V (2.7V to 3.6V)
Unit
R1
16667
1103
Ω
R2
15385
1554
Ω
R
TH
8000
645
Ω
V
TH
1.20
1.75
V
Data Retention Characteristics 
(Over the Operating Range)
Parameter
Description
Conditions
Min
Typ 
Max
Unit
V
DR
V
CC
 for Data Retention
1.5
V
I
CCDR 
Data Retention Current
V
CC
 = 1.5V, 
CE
1
 > V
CC
 − 0.2V or CE
2
 < 0.2V, 
V
IN
 > V
CC
 
− 0.2V or V
IN
 < 0.2V
1
4
µA
t
CDR 
Chip Deselect to Data Retention Time
0
ns
t
Operation Recovery Time
t
RC
ns
Data Retention Waveform 
V
CC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUT
V
Equivalent to:
THEVENIN
EQUIVALENT
ALL INPUT PULSES
R
TH
R1
V
CC(min)
V
CC(min)
t
CDR
V
DR
> 1.5V
DATA RETENTION MODE
t
R
V
CC
CE
Notes: 
9. Full device AC operation requires linear V
CC
 ramp from V
DR 
to V
CC(min)
 > 100 
µs or stable at V
CC(min)
 > 100 
µs.
10. CE is the logical combination of CE
1
 and CE
2
. When CE
1
 is LOW and CE
is HIGH, CE is LOW; when CE
1
 is HIGH or CE
2
 is LOW, CE is HIGH.