Freescale Semiconductor Tower System Eval Kit for MC9S12GN32 TWR-S12GN32-KIT TWR-S12GN32-KIT Hoja De Datos

1220

Freescale Semiconductor

°C To +160°C)

1

The 8-bit mode operation is structurally tested in production test. Absolute values are tested in 10-bit mode.

2

These values include the quantization error which is inherently 1/2 count for any A/D converter.

3

LQFP 48 and bigger

4

LQFP 32 and smaller

S12GN16, S12GN32

Supply voltage 3.13V < V

DDA

 < 4.5 V, 150

o

C < T

J

 < 160

o

C, V

REF

 = V

RH

 - V

RL

 = V

DDA

, f

ADCCLK

 = 8.0MHz

The values are tested to be valid with no port AD output drivers switching simultaneous with conversions.

1

The 8-bit mode operation is structurally tested in production test. Absolute values are tested in 10-bit mode.

1

C Resolution

10-Bit

LSB

3.22

mV

2

C Differential Nonlinearity

10-Bit

DNL

±1

counts

3

C Integral Nonlinearity

10-Bit

INL

±1

counts

4

C Absolute Error

2

2

These values include the quantization error which is inherently 1/2 count for any A/D converter.

10-Bit

3

10-Bit

4

3

LQFP 48 and bigger

4

LQFP 32 and smaller

AE

±2

±2

counts

5

C Resolution

8-Bit

LSB

12.89

mV

6

C Differential Nonlinearity

8-Bit

DNL

±0.3

counts

7

C Integral Nonlinearity

8-Bit

INL

±0.5

counts

8

C Absolute Error

8-Bit

AE

±1

counts