Freescale Semiconductor Tower System Eval Kit for MC9S12GN32 TWR-S12GN32-KIT TWR-S12GN32-KIT Hoja De Datos

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Electrical Characteristics
MC9S12G Family Reference Manual,
Rev.1.23
1222
Freescale Semiconductor
A.4.3.2
ADC Analog Input Parasitics
Figure A-2. ADC Analog Input Parasitics
A.4.4
ADC Temperature Sensor
Table A-30. ADC Temperature Sensor
A.5
ACMP Characteristics
This section describes the electrical characteristics of the analog comparator.
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
T  Temperature Sensor Slope
dV
TS
-4.0
-3.8
-3.6
mV/
°C
PAD00-
PAD11
VDDA
VSSA
T
jmax
=130
o
C
I
leakp
 < 0.5
µA
I
leakn
 < 0.5
µA
C
bottom
3.7pF < S/H Cap < 6.2pF
(incl parasitics)
920
Ω < R
path
 < 9.9K
Ω
(incl parasitics)
sampling time is 4 to 24 adc clock cycles of
0.25MHz to 8MHz -> 96
µs >= tsample >= 500ns
Switch resistance depends on input voltage, corner ranges are shown.
Leakage current is guaranteed by specification.
Complete 10bit conversion takes between 19 and 41 adc clock cycles
connected to low ohmic
supply during sampling
C
top
C
top
 potential just prior to sampling is either
a)  ~ last converted channel potential or
b) ground level if S/H discharge feature is enabled.