Atmel SAM4S-XPLD Atmel ATSAM4S-XPLD ATSAM4S-XPLD Hoja De Datos
Los códigos de productos
ATSAM4S-XPLD
235
SAM4S [DATASHEET]
11100E–ATARM–24-Jul-13
Figure 13-3. Application Test Environment Example
13.4
Debug and Test Pin Description
Chip 2
Chip n
Chip 1
SAM4
SAM4-based Application Board In Test
JTAG
Connector
Tester
Test Adaptor
JTAG
Probe
Table 13-1. Debug and Test Signal List
Signal Name
Function
Type
Active Level
Reset/Test
NRST
Microcontroller Reset
Input/Output
Low
TST
Test Select
Input
SWD/JTAG
TCK/SWCLK
Test Clock/Serial Wire Clock
Input
TDI
Test Data In
Input
TDO/TRACESWO
Test Data Out/Trace
Asynchronous Data Out
Asynchronous Data Out
Output
TMS/SWDIO
Test Mode Select/Serial Wire
Input/Output
Input/Output
Input
JTAGSEL
JTAG Selection
Input
High