Intel P4500 CP80617004803AA Fiche De Données
Codes de produits
CP80617004803AA
Signal Description
78
Datasheet
6.9
TAP Signals
Table 6-29.TAP Signals
Signal Name
Description
Direction/Buffer
Type
TCK
TCK (Test Clock): Provides the clock input
for the processor Test Bus (also known as
the Test Access Port).
for the processor Test Bus (also known as
the Test Access Port).
I
CMOS
TDI
TDI (Test Data In): Transfers serial test
data into the processor. TDI provides the
serial input needed for JTAG specification
support.
data into the processor. TDI provides the
serial input needed for JTAG specification
support.
I
CMOS
TDO
Test Data Output
O
CMOS
TDI_M
Test Data In for the GPU/Memory core:
Tie TDI_M and TDO_M together on the
motherboard
Tie TDI_M and TDO_M together on the
motherboard
I
CMOS
TDO_M
Test Data Output from the processor
core: Tie TDO_M and TDI_M together on the
motherboard.
core: Tie TDO_M and TDI_M together on the
motherboard.
O
CMOS
TMS
TMS (Test Mode Select): A JTAG
specification support signal used by debug
tools.
specification support signal used by debug
tools.
I
CMOS
TRST#
TRST# (Test Reset) Boundary-Scan test
reset pin
reset pin
I
CMOS
TAPPWRGOOD
Power good for ITP
O
Asynchronous CMOS