Microchip Technology MA330025-1 Fiche De Données
2009-2012 Microchip Technology Inc.
DS70616G-page 507
dsPIC33EPXXX(GP/MC/MU)806/810/814 and PIC24EPXXX(GP/GU)810/814
I
IL
Input Leakage Current
)
DI50
I/O Pins 5V Tolerant
—
—
±1
A
V
SS
V
PIN
V
DD
,
Pin at high-impedance
DI51
I/O Pins Not 5V Tolerant
(
)
—
—
±1
A
V
SS
V
PIN
V
DD
,
Pin at high-impedance,
-40°C
-40°C
T
A
+85°C
DI51a
I/O Pins Not 5V Tolerant
(
)
—
—
±1
A
Analog pins shared
with external reference
pins,
-40°C
with external reference
pins,
-40°C
T
A
+85°C
DI51b
I/O Pins Not 5V Tolerant
(
)
—
—
±1
A
V
SS
V
PIN
V
DD
, Pin
at high-impedance,
-40°C
-40°C
T
A
+125°C
DI51c
I/O Pins Not 5V Tolerant
(
)
—
—
±1
A
Analog pins shared
with external reference
pins,
-40°C
with external reference
pins,
-40°C
T
A
+125°C
DI55
MCLR
—
—
±1
A
V
SS
V
PIN
V
DD
DI56
OSC1
—
—
±1
A
V
SS
V
PIN
V
DD
,
XT and HS modes
TABLE 32-9:
DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS (CONTINUED)
DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature
(unless otherwise stated)
Operating temperature
-40°C
T
A
+85°C for Industrial
-40°C
T
A
+125°C for Extended
Param. Symbol
Characteristic
Min.
Typ
(
1
)
Max.
Units
Conditions
Note 1: Data in “Typ” column is at 3.3V, +25°C unless otherwise stated.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current can be measured at different input
voltages.
voltages.
3: Negative current is defined as current sourced by the pin.
4: See “
4: See “
Pin Diagrams
” for the 5V tolerant I/O pins.
5: V
IL
source < (V
SS
– 0.3). Characterized but not tested.
6: Non-5V tolerant pins V
IH
source > (V
DD
+ 0.3), 5V tolerant pins V
IH
source > 5.5V. Characterized but not
tested.
7: Digital 5V tolerant pins cannot tolerate any “positive” input injection current from input sources > 5.5V.
8: Injection currents > | 0 | can affect the ADC results by approximately 4-6 counts.
9: Any number and/or combination of I/O pins not excluded under I
8: Injection currents > | 0 | can affect the ADC results by approximately 4-6 counts.
9: Any number and/or combination of I/O pins not excluded under I
ICL
or I
ICH
conditions are permitted, pro-
vided the mathematical “absolute instantaneous” sum of the input injection currents from all pins do not
exceed the specified limit. Characterized but not tested.
exceed the specified limit. Characterized but not tested.
10: These parameters are characterized, but not tested.