Atmel Xplained Pro Evaluation Kit ATSAM4E-XPRO ATSAM4E-XPRO Fiche De Données
Codes de produits
ATSAM4E-XPRO
SAM4E [DATASHEET]
Atmel-11157D-ATARM-SAM4E16-SAM4E8-Datasheet_12-Jun-14
418
22.3
Parallel Fast Flash Programming
22.3.1 Device Configuration
In Fast Flash Programming Mode, the device is in a specific test mode. Only a certain set of pins is significant. The
rest of the PIOs are used as inputs with a pull-up. The crystal oscillator is in bypass mode. Other pins must be left
unconnected.
rest of the PIOs are used as inputs with a pull-up. The crystal oscillator is in bypass mode. Other pins must be left
unconnected.
Figure 22-1.
SAM4ExE Parallel Programming Interface
NCMD
PGMNCMD
RDY
PGMRDY
NOE
PGMNOE
NVALID
PGMNVALID
MODE[3:0]
PGMM[3:0]
DATA[15:0]
PGMD[15:0]
XIN
TST
VDDIO
PGMEN0
PGMEN1
0 - 50MHz
VDDIO
VDDCORE
VDDIO
VDDPLL
GND
VDDIO
Table 22-1.
Signal Description List
Signal Name
Function
Type
Active
Level
Comments
Power
VDDIO
I/O Lines Power Supply
Power
VDDCORE
Core Power Supply
Power
VDDPLL
PLL Power Supply
Power
GND
Ground
Ground
Clocks
XIN
Main Clock Input.
This input can be tied to GND. In this
case, the device is clocked by the internal
RC oscillator.
case, the device is clocked by the internal
RC oscillator.
Input
32 kHz to 50 MHz
Test
TST
Test Mode Select
Input
High
Must be connected to VDDIO
PGMEN0
Test Mode Select
Input
High
Must be connected to VDDIO
PGMEN1
Test Mode Select
Input
High
Must be connected to VDDIO
PIO
PGMNCMD
Valid command available
Input
Low
Pulled-up input at reset