Canon WITE32 Manuale Utente
WITE32 Release Notes Version 3.11
The new Erase Setup button is added to the configuration dialog box of the test. When it is clicked, an Erase
configure dialog box will open:
configure dialog box will open:
The caption shows which test erase
operation configuration is being edited
operation configuration is being edited
Selects between using a System Erase
configuration or Custom Erase configuration
configuration or Custom Erase configuration
Figure 5
SNR Test Erase Configuration in WITE32 version 3.11
2.1.4 Tests With Band Erase Configuration
The following tests perform a band erase operation and had their custom band erase configurations in earlier WITE32
versions:
versions:
Some test configurations have been modified to use System Band Erase. Their original band erase operation
configurations are converted to the new format:
configurations are converted to the new format:
• Error Tests module: Popcorn test.
• GMA Tests module: Low Erase Current, Single Track Critical Erase Current, Multi-Track Critical Erase
• GMA Tests module: Low Erase Current, Single Track Critical Erase Current, Multi-Track Critical Erase
Current, Missing Pulse Avalanche, Extra Pulse Avalanche, and Undershoot Avalanche tests.
• Parametric Tests module: Spectral Integral SNR test.
• Erase and Band Erase operations of the production test.
• Erase and Band Erase operations of the production test.
Starting from WITE32 version 3.11 these tests are modified to either use System Band Erase, or use custom band
erase settings. Their original band erase configurations are converted to the new format.
erase settings. Their original band erase configurations are converted to the new format.
Guzik Technical Enterprises
10