Canon WITE32 Manuale Utente
WITE32 Release Notes Version 3.11
CAUTION: When you upgrade tos WITE32 version 3.11 from the previous versions of WITE32, the product update
procedure performs the conversion of the old band erase configuration (specified in terms of number of
tracks to erase) to the new band erase configuration (specified in terms of From, To, and Step values).
This conversion uses the track size value specified in the Product Parameters dialog box for the selected
spinstand driver. Please make sure that you use proper spinstand driver and correct track size before you
update your product to WITE32 version 3.11.
tracks to erase) to the new band erase configuration (specified in terms of From, To, and Step values).
This conversion uses the track size value specified in the Product Parameters dialog box for the selected
spinstand driver. Please make sure that you use proper spinstand driver and correct track size before you
update your product to WITE32 version 3.11.
!
2.1.1 Using System Erase In WITE32 Tests
All Guzik tests have been modified to use the system erase or system band erase configuration. An erase (or band
erase) operation by a test is done in one of the following ways:
erase) operation by a test is done in one of the following ways:
1. If a test does not have its own erase (or band erase) operation configuration, the system erase (or band erase)
configuration settings will be used to erase the media.
2. If a test has its own configuration, it can be configured to either use system erase (or band erase) operation
setup, or to override the system erase (or band erase) operation setup with the custom settings.
2.1.2 Tests Without Erase Configuration
The following tests perform erase operation and were hard coded to erase the media using a Positive DC mode in
earlier WITE32 versions:
earlier WITE32 versions:
• MR Tests module: Write-Impedance and Head Polarity tests.
• Parametric Tests module: Parametric, PWN Stability, Overwrite, and Amplitude Stability tests.
• PRML Tests module: Guzik Channel Optimization test.
• Composite Tests module: Frequency, Triple-Track, and Saturation tests.
• WITE Control module: Servo Calibration operation.
• Parametric Tests module: Parametric, PWN Stability, Overwrite, and Amplitude Stability tests.
• PRML Tests module: Guzik Channel Optimization test.
• Composite Tests module: Frequency, Triple-Track, and Saturation tests.
• WITE Control module: Servo Calibration operation.
Starting from WITE32 version 3.11 these tests use System Erase configuration.
2.1.3 Tests With Erase Configuration
The following tests perform an erase operation and had their custom erase configurations in earlier WITE32 versions:
• 747 Tests module: 747 Comparator test.
• Digital Parametric Tests module: Digital Parametric test.
• Parametric Tests module: SNR and Spectral SNR tests.
• Digital Parametric Tests module: Digital Parametric test.
• Parametric Tests module: SNR and Spectral SNR tests.
Starting from WITE32 version 3.11 these tests are modified to either use System Erase configuration, or use custom
erase settings. Their original erase operation configurations are converted to the new format of the custom erase
settings.
erase settings. Their original erase operation configurations are converted to the new format of the custom erase
settings.
Guzik Technical Enterprises
8