Fujifilm Xeon 5050 S26361-F3248-L300 Scheda Tecnica

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Dual-Core Intel® Xeon® Processor 5000 Series Datasheet

connect to the rest of the chain unless one of the other components is capable of 
accepting an input of the appropriate voltage. Similar considerations must be made for 
TCK, TMS, and TRST#. Two copies of each signal may be required with each driving a 
different voltage level. 

Intel supports and validates dual processor configurations only in which both 
processors operate with the same FSB frequency, core frequency, and have the same 
internal cache sizes. Mixing components operating at different internal clock 
frequencies is not supported and will not be validated by Intel [Note: Processors within 
a system must operate at the same frequency per bits [15:8] of the 
IA32_FLEX_BRVID_SEL MSR; however this does not apply to frequency transitions 
initiated due to thermal events, Enhanced HALT, Enhanced Intel SpeedStep

®

 

Technology transitions, or assertion of the FORCEPR# signal (See 

)]. Low voltage (LV), mid-voltage (MV) and full-power 64-bit Intel Xeon 

processors should not be mixed within a system. Not all operating systems can support 
dual processors with mixed frequencies. Intel does not support or validate operation of 
processors with different cache sizes. Mixing processors of different steppings but the 
same model (as per CPUID instruction) is supported. Details regarding the CPUID 
instruction are provided in the AP-485 Intel

Instruction application note.

 specifies absolute maximum and minimum ratings. Within functional 

operation limits, functionality and long-term reliability can be expected.

At conditions outside functional operation condition limits, but within absolute 
maximum and minimum ratings, neither functionality nor long term reliability can be 
expected. If a device is returned to conditions within functional operation limits after 
having been subjected to conditions outside these limits, but within the absolute 
maximum and minimum ratings, the device may be functional, but with its lifetime 
degraded depending on exposure to conditions exceeding the functional operation 
condition limits.

At conditions exceeding absolute maximum and minimum ratings, neither functionality 
nor long-term reliability can be expected. Moreover, if a device is subjected to these 
conditions for any length of time then, when returned to conditions within the 
functional operating condition limits, it will either not function or its reliability will be 
severely degraded.

Although the processor contains protective circuitry to resist damage from static 
electric discharge, precautions should always be taken to avoid high static voltages or 
electric fields

.

V

CC

Core voltage with respect to V

SS

-0.30

1.55

V

V

TT

FSB termination voltage with respect to 

V

SS

-0.30

1.55

V

T

CASE

Processor case temperature

See 

See 

° C

T

STORAGE

Storage temperature

-40

85

° C

3,  4,  5