Freescale Semiconductor Evaluation Board MPR031/2 for 2- or 3-pad touch sensor controllers DEMOMPR031 DEMOMPR031 データシート

Sensors

24

Freescale Semiconductor

This section contains electrical and timing specifications.

Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the 
limits specified in 

 may affect device reliability or cause permanent damage to the device. For functional operating 

conditions, refer to the remaining tables in this section. This device contains circuitry protecting against damage due to high static 
voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher 
than maximum-rated voltages to this high-impedance circuit.

Normal handling precautions should be used to avoid exposure to static discharge.

Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels of static without 
suffering any permanent damage. During the device qualification ESD stresses were performed for the Human Body Model 
(HBM), the Machine Model (MM) and the Charge Device Model (CDM).

A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete 
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot 
temperature, unless specified otherwise in the device specification.

Supply Voltage

V

DD

-0.3 to +2.9

V

Input Voltage

SCL, SDA, IRQ

V

IN

V

SS

 - 0.3 to V

DD

 + 0.3

V

Operating Temperature Range

TSG

-40 to +85

°C

Storage Temperature Range

T

SG

-40 to +125

°C

Human Body Model (HBM)

V

ESD

±4000

V

Machine Model (MM) 

V

ESD

±200

V

Charge Device Model (CDM)

V

ESD

±500

V

Latch-up current at T

A

 = 85°C

I

LATCH

±100

mA