Freescale Semiconductor Evaluation Board MPR031/2 for 2- or 3-pad touch sensor controllers DEMOMPR031 マニュアル

目次

• 1 Device Overview

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  • 1.1 Introduction

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  • 1.2 Internal Block Diagram

    2
• 2 External Signal Description

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  • 2.1 Device Pin Assignment

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    • Table 1. Device Pin Assignment

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  • 2.2 Recommended System Connections

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  • 2.3 Serial Interface

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    • 2.3.1 Serial-Addressing

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    • 2.3.2 Start and Stop Conditions

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    • 2.3.3 Bit Transfer

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    • 2.3.4 Acknowledge

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    • 2.3.5 The Slave Address

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    • Table 2.

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    • 2.3.6 Message Format for Writing the MPR03X

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    • 2.3.7 Message Format for Reading the MPR03X

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    • 2.3.8 Operation with Multiple Master

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  • 2.4 Register Address Map

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    • Table 3. Register Address Map

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• 3 Functional Overview

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  • 3.1 Introduction

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  • 3.2 Understanding the Basics

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  • 3.3 Implementation

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• 4 Modes of Operation

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  • 4.1 Introduction

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  • 4.2 Stop Mode

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    • 4.2.1 Initial Power Up

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    • Table 4. Power-Up Register Configurations

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    • 4.2.2 Stop Mode Usage

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  • 4.3 Run1 Mode

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  • 4.4 Run2 Mode

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  • 4.5 Electrode Configuration Register

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    • Table 5. Electrode Configuration Register Field Descriptions

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• 5 Output Mechanisms

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  • 5.1 Introduction

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  • 5.2 Touch Status

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    • 5.2.1 Touch Status Register

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    • Table 6. Touch Pad Status Register Field Descriptions

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  • 5.3 Filtered Data

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    • 5.3.1 Filtered Data Low Register

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    • Table 7. Filtered Data Low Register Field Descriptions

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    • 5.3.2 Filtered Data High Register

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    • Table 8. Filtered Data High Register Field Descriptions

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  • 5.4 Baseline Values

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    • 5.4.1 Baseline Value Register

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    • Table 9. Filtered Data High Register Field Descriptions

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• 6 Interrupts

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  • 6.1 Introduction

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  • 6.2 Triggering an Interrupt

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  • 6.3 Interrupt Handling

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  • 6.4 IRQ Pin

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• 7 Theory of Operation

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  • 7.1 Introduction

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  • 7.2 Capacitance Measurement

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    • Table 10.

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  • 7.3 Sensitivity

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    • Table 11.

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  • 7.4 Configuration

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    • 7.4.1 AFE Configuration Register

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    • Table 12. AFE Configuration Register Field Descriptions

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• 8 Filtering

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  • 8.1 Introduction

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  • 8.2 First Level

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  • 8.3 Second Level

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    • 8.3.1 Filter Configuration Register

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    • Table 13. Filter Configuration Register Field Descriptions

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  • 8.4 Third Level Filter

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    • 8.4.1 Max Half Delta Register

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    • Table 14. Max Half Delta Register Field Descriptions

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    • 8.4.2 Noise Half Delta Register

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    • Table 15. Noise Half Delta Register Field Descriptions

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    • 8.4.3 Noise Count Limit Register

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    • Table 16. Noise Count Limit Register Field Descriptions

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• 9 Touch Detection

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  • 9.1 Introduction

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  • 9.2 Thresholds

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    • 9.2.1 Touch Threshold Register

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    • Table 17. Touch Threshold Register Field Descriptions

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    • 9.2.2 Release Threshold Register

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    • Table 18. Release Threshold Register Field Descriptions

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• Appendix A Electrical Characteristics

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  • A.1 Introduction

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  • A.2 Absolute Maximum Ratings

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    • Table 19. Absolute Maximum Ratings - Voltage (with respect to VSS)

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  • A.3 ESD and Latch-up Protection Characteristics

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    • Table 20. ESD and Latch-up Test Conditions

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  • A.4 DC Characteristics

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    • Table 21. DC Characteristics (Temperature Range = -40C to 85C Ambient)

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  • A.5 AC Characteristics

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  • A.6 I2C AC Characteristics

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    • Table 22. I2C AC Characteristics

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• Appendix B Brief Register Descriptions

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• Appendix C Ordering Information

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  • C.1 Ordering Information

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  • C.2 Device Numbering Scheme

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