Rohde Schwarz Rohde & Schwarz HMO1002 2-channel oscilloscope, Digital Storage oscilloscope, 21-1002-RS00 데이터 시트
제품 코드
21-1002-RS00
2
General information regarding the CE marking
General infor-
mation regar-
ding the CE
marking
KONFORMITÄTSERKLÄRUNG
DECLARATION OF CONFORMITY
DECLARATION DE CONFORMITE
DECLARACIÓN DE CONFORMIDAD
Hersteller / Manufacturer / Fabricant / Fabricante:
HAMEG Instruments GmbH · Industriestraße 6 · D-63533 Mainhausen
Die HAMEG Instruments GmbH bescheinigt die Konformität für das Produkt
The HAMEG Instruments GmbH herewith declares conformity of the product
HAMEG Instruments GmbH déclare la conformite du produit
HAMEG Instruments GmbH certifica la conformidad para el producto
Bezeichnung:
Oszilloskop
Product name:
Oscilloscope
Designation: Oscilloscope
Descripción: Osciloscopio
Typ / Type / Type / Tipo:
R&S®HMO1002
mit / with / avec / con:
Optionen / Options /
Options / Opciónes:
mit den folgenden Bestimmungen / with applicable regulations /
avec les directives suivantes / con las siguientes directivas:
EMV Richtlinien / EMC Directives / Directives CEM / Directivas IEM:
2004/108/EG;
Niederspannungsrichtlinie / Low-Voltage Equipment Directive / Directive des
equipements basse tension / Directiva de equipos de baja tensión:
2006/95/EG
Angewendete harmonisierte Normen / Harmonized standards applied /
Normes harmonisées utilisées / Normas armonizadas utilizadas:
Sicherheit / Safety / Sécurité / Seguridad:
DIN EN 61010-1; VDE 0411-1: 07/2011
Überspannungskategorie / Overvoltage category / Catégorie de surtension /
Categoría de sobretensión: II
Verschmutzungsgrad / Degree of pollution / Degré de pollution /
Nivel de polución: 2
Elektromagnetische Verträglichkeit / Electromagnetic compatibility /
Compatibilité électromagnétique / Compatibilidad electromagnética:
EMV Störaussendung / EMI Radiation / Emission CEM / emisión IEM:
DIN EN 61000-6-3: 09/2007 (IEC/CISPR22, Klasse / Class / Classe / classe B)
VDE 0839-6-3: 04/2007
Störfestigkeit / Immunity / Imunitee / inmunidad:
DIN EN 61000-6-2; VDE 0839-6-2: 03/2006
Oberschwingungsströme / Harmonic current emissions / Émissions de courant
harmonique / emisión de corrientes armónicas:
DIN EN 61000-3-2; VDE 0838-2: 06/2009
Spannungsschwankungen u. Flicker / Voltage fluctuations and flicker /
Fluctuations de tension et du flicker / fluctuaciones de tensión y flicker:
DIN EN 61000-3-3; VDE 0838-3: 03/2010
Datum / Date / Date / Fecha
08. 04. 2013
Unterschrift / Signature / Signatur / Signatura
Holger Asmussen
General Manager
General information regarding the CE marking
The instruments fulfill the regulations of the EMC directive. The conformity
test based on the actual generic- and product standards. In cases where
different limit values are applicable, the instrument applies the severer
standard. For emission the limits for residential, commercial and light
industry are applied. Regarding the immunity (susceptibility) the limits for
industrial environment have been used.
test based on the actual generic- and product standards. In cases where
different limit values are applicable, the instrument applies the severer
standard. For emission the limits for residential, commercial and light
industry are applied. Regarding the immunity (susceptibility) the limits for
industrial environment have been used.
The measuring- and data lines of the instrument have much influence on
emission and immunity and therefore on meeting the acceptance limits.
For different applications the lines and/or cables used may be different.
For measurement operation the following hints and conditions regarding
emission and immunity should be observed:
emission and immunity and therefore on meeting the acceptance limits.
For different applications the lines and/or cables used may be different.
For measurement operation the following hints and conditions regarding
emission and immunity should be observed:
1. Data cables
For the connection between instrument interfaces and external devices,
(computer, printer etc.) sufficiently screened cables must be used. With-
out a special instruction in the manual for a reduced cable length, the
maximum cable length of a dataline must be less than 3 meters and not
be used outside buildings. If an interface has several connectors only one
connector must have a connection to a cable.
For the connection between instrument interfaces and external devices,
(computer, printer etc.) sufficiently screened cables must be used. With-
out a special instruction in the manual for a reduced cable length, the
maximum cable length of a dataline must be less than 3 meters and not
be used outside buildings. If an interface has several connectors only one
connector must have a connection to a cable.
Basically interconnections must have a double screening.
2. Signal cables
Basically test leads for signal interconnection between test point and in-
strument should be as short as possible. Without instruction in the manual
for a shorter length, signal lines must be less than 3 meters and not be
used outside buildings.
Basically test leads for signal interconnection between test point and in-
strument should be as short as possible. Without instruction in the manual
for a shorter length, signal lines must be less than 3 meters and not be
used outside buildings.
Signal lines must screened (coaxial cable - RG58/U). A proper ground con-
nection is required. In combination with signal generators double screened
cables (RG223/U, RG214/U) must be used.
nection is required. In combination with signal generators double screened
cables (RG223/U, RG214/U) must be used.
3. Influence on measuring instruments
Under the presence of strong high frequency electric or magnetic fields,
even with careful setup of the measuring equipment, influence of such
signals is unavoidable.
This will not cause damage or put the instrument out of operation. Small
deviations of the measuring value (reading) exceeding the instruments
specifications may result from such conditions in individual cases.
Under the presence of strong high frequency electric or magnetic fields,
even with careful setup of the measuring equipment, influence of such
signals is unavoidable.
This will not cause damage or put the instrument out of operation. Small
deviations of the measuring value (reading) exceeding the instruments
specifications may result from such conditions in individual cases.
4. RF immunity of oscilloscopes.
4.1 Electromagnetic RF field
The influence of electric and magnetic RF fields may become visible (e.g.
RF superimposed), if the field intensity is high. In most cases the coupling
into the oscilloscope takes place via the device under test, mains/line
supply, test leads, control cables and/or radiation. The device under test as
well as the oscilloscope may be effected by such fields.
The influence of electric and magnetic RF fields may become visible (e.g.
RF superimposed), if the field intensity is high. In most cases the coupling
into the oscilloscope takes place via the device under test, mains/line
supply, test leads, control cables and/or radiation. The device under test as
well as the oscilloscope may be effected by such fields.
Although the interior of the oscilloscope is screened by the cabinet, direct
radiation can occur via the CRT gap. As the bandwidth of each amplifier
stage is higher than the total –3 dB bandwidth of the oscilloscope, the
influence of RF fields of even higher frequencies may be noticeable.
radiation can occur via the CRT gap. As the bandwidth of each amplifier
stage is higher than the total –3 dB bandwidth of the oscilloscope, the
influence of RF fields of even higher frequencies may be noticeable.
4.2 Electrical fast transients / electrostatic discharge
Electrical fast transient signals (burst) may be coupled into the oscillo-
scope directly via the mains/line supply, or indirectly via test leads and/
or control cables. Due to the high trigger and input sensitivity of the
oscilloscopes, such normally high signals may effect the trigger unit and/
or may become visible on the TFT, which is unavoidable. These effects can
also be caused by direct or indirect electrostatic discharge.
Electrical fast transient signals (burst) may be coupled into the oscillo-
scope directly via the mains/line supply, or indirectly via test leads and/
or control cables. Due to the high trigger and input sensitivity of the
oscilloscopes, such normally high signals may effect the trigger unit and/
or may become visible on the TFT, which is unavoidable. These effects can
also be caused by direct or indirect electrostatic discharge.
HAMEG Instruments GmbH