Texas Instruments Evaluation Kit for FPD-Link Family of Serializer and Deserializer LVDS Devices FLINK3V8BT-85/NOPB FLINK3V8BT-85/NOPB 데이터 시트

FPD-Link Evaluation Kit User’s Manual 

 

National Semiconductor Corporation 

 

Rev 3.0 
Date: 9/25/2007 
Page 17 of 25 

 
The following is a list of typical test equipment that may be used to generate signals 
for the TX inputs: 
 
1)  Graphics card or GUI controller with digital RGB (LVTTL) output. 
2)  TEK HFS9009 - This pattern generator along with 9DG2 Cards may be used to 

generate input signals and also the clock signal. 

3)  TEK DG2020 - This generator may also be used to generate data and clock 

signals.  

4)  TEK MB100 BERT - This bit error rate tester may be used for both signal source 

and receiver. 

5)  Any other signal / pattern generator that generates the correct input levels as 

specified in the datasheet. 

 
The following is a list of typically test equipment that may be used to monitor the 
output signals from the RX: 
 
1)  LCD Display Panel which supports digital RGB (LVTTL) inputs. 
2)  TEK MB100 BERT - Receiver. 
3)  Any SCOPE with 50 Ohm inputs or high impedance probes. 
 
 
LVDS signals may be easily measured with high impedance / high bandwidth 
differential probes such as the TEK P6247 or P6248 differential probes.  
 
The picture below shows a typical test set up using a Graphics Card and LCD Panel.  
 

 

Digital RGB (TTL)

from Graphic

Contoller

Digital RGB (TTL)

to Panel

Transmitter

Board

Receiver

Board

LVDS Interface

Cable

Graphics

Card

AGP/PCI/ISA Bus

LCD Panel