Texas Instruments Test System for BQ27000 BQ27200 Based Circuit Boards BQ27X00-TESTER BQ27X00-TESTER 데이터 시트
제품 코드
BQ27X00-TESTER
www.ti.com
BQ27000
DRK PACKAGE
(BOTTOM VIEW)
RBI
VCC
VSS
D/C
HDQ
1
2
3
4
5
11
10
9
8
7
6
PGM GPIO
SRP
SRN
BAT
RBI
VCC
VSS
SCL
SDA
1
2
3
4
5
11
10
9
8
7
6
PGM GPIO
SRP
SRN
BAT
bq27000DRK
bq27200DRK
BQ27200
DRK PACKAGE
(BOTTOM VIEW)
DEVICE INFORMATION
SLUS556D – SEPTEMBER 2004 – REVISED MARCH 2006
TIMING DIAGRAMS (continued)
TERMINAL FUNCTIONS
TERMINAL
I/O
DESCRIPTION
NAME
bq27000
bq27200
BAT
6
6
I
Battery voltage sense input
D/C
4
-
-
Do not connect. Must be left floating or tied to V
SS
GPIO
9
9
I/O
General purpose input/output
HDQ
5
-
I/O
Single wire HDQ serial interface
PGM
10
10
I
EEPROM programming voltage input
RBI
1
1
I
Register back-up input
SCL
-
4
I
Serial clock input (I
2
C)
SDA
-
5
I/O
Serial data input (I
2
C)
SRN
7
7
I
Current sense input (negative)
SRP
8
8
I
Current sense input (positive)
VCC
2
2
I
V
CC
supply input
VSS
3
3
-
Ground input
VSS
11
11
-
Ground shield
6