Texas Instruments Test System for BQ27000 BQ27200 Based Circuit Boards BQ27X00-TESTER BQ27X00-TESTER 데이터 시트

제품 코드
BQ27X00-TESTER
다운로드
페이지 33
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FUNCTIONAL BLOCK DIAGRAMS
Bandgap,
Reference
and Bias
Temperature
Compensated
Precision Oscillator
Clock
Generator
EEPROM
RAM
SCPU
System I/O
and Control
Temperature
Sensor
ADC
2
VCC
8
SRP
7
SRN
6
BAT
5
HDQ
9
GPIO
1
RBI
3
VSS
bq27000
10 RGM
Autocalibration
and
Autocompensating
Coulomb Counter
UDG−03040
UDG−04123
Bandgap,
Reference
and Bias
Autocalibration and
Autocompensating
Coulomb Counter
Temperature
Compensated
Precision Oscillator
Clock
Generator
EEPROM
RAM
SCPU
System I/O
and Control
Temperature
Sensor
ADC
2
VCC
8
SRP
7
SRN
6
BAT
4
SCL
9
GPIO
1
RBI
3
VSS
bq27200
5
SDA
10 RGM
FUNCTIONAL DESCRIPTION
SLUS556D – SEPTEMBER 2004 – REVISED MARCH 2006
The bqJUNIOR determines battery capacity by monitoring the amount of charge input to or removed from a
Li-Ion or Li-Pol battery. The bqJUNIOR measures discharge and charge currents, monitors the battery for low
voltage thresholds, and compensates for self-discharge, aging, temperature, and discharge rate. Current is
measured across a small value series resistor between the negative terminal of the battery and the pack ground
(see R
S
in
). Available capacity is reported with a resolution of 3.57 µVh. Time-To-Empty reporting in
minutes at standby, peak, actual, and at-rate currents allows the requirements for host-based calculations to be
greatly reduced or eliminated; reading a single register pair provides useful and meaningful information to the
end user of the application.
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