Texas Instruments DAC5681ZEVM - DAC5681Z Evaluation Module DAC5681ZEVM DAC5681ZEVM 데이터 시트
제품 코드
DAC5681ZEVM
6
DAC5681/81z/82z Initial Power Up and Test
6.1
Test Setup Block Diagram
6.2
Test Equipment
6.3
Calibration
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DAC5681/81z/82z Initial Power Up and Test
The recommended test setup for the EVM is shown in
. In this setup the Texas Instruments
TSW3100 pattern generator solution is used to supply the LVDS input data.
Figure 13. DAC5682z EVM Driven by TSW3100 Pattern Generator
The test equipment listed below is required to evaluate the EVM. Other equipment may be substituted,
however results may vary due to instrument limitations.
however results may vary due to instrument limitations.
•
Power supplies—1.8 V (DAC digital), 3.3 V (DAC analog), and 5 V (RF modulator)
•
Spectrum Analyzer—Rhode & Schwarz FSU, FSQ, or equivalent. This is necessary to measure the
noise floor ACPR greater than 70 dBm with the noise correction option.
noise floor ACPR greater than 70 dBm with the noise correction option.
•
Pattern generator—TSW3100 using LVDS mode, or some other LVDS capable generator.
•
Oscilloscope—probe clock and data lines for troubleshooting.
•
Digital volt meter—verify signal levels.
To measure the proper output power, the insertion loss of the analyzer cable must be calibrated. Measure
a calibrated 0 dBm source to see how much loss is in the cable at the frequency of interest.
a calibrated 0 dBm source to see how much loss is in the cable at the frequency of interest.
SLAU236A – November 2007 – Revised October 2008
DAC5681/81z/82z EVM
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