Lucent Technologies R5SI Manual Do Utilizador
DEFINITY Enterprise Communications Server Release 5
Maintenance and Test for R5vs/si
Maintenance and Test for R5vs/si
555-230-123
Issue 1
April 1997
Maintenance Object Repair Procedures
Page 10-1170
PR-MEM (TN790 RISC Memory)
10
Memory Parity Error Detection Test (#87)
This test is a nondestructive test. The test is run on a few reserved locations in
memory. A failure of this test indicates a failure on the Processor circuit pack.
memory. A failure of this test indicates a failure on the Processor circuit pack.
This test determines if the parity circuitry is working. Accordingly, the test
determines if parity errors can be detected. The parity circuitry is used to detect
DRAM memory failures.
determines if parity errors can be detected. The parity circuitry is used to detect
DRAM memory failures.
Table 10-353.
TEST #86 Text Checksum Test
Error Code
Test
Result
Description/ Recommendation
100
ABORT
The test did not complete within the allowable time period.
1. Retry the command.
1029 2014
2015 2016
2017 2018
2020 2022
2024 2025
2051
2015 2016
2017 2018
2020 2022
2024 2025
2051
ABORT
Refer to STBY-SPE Maintenance documentation for a description of
these error codes.
these error codes.
2500
ABORT
Internal system error
1. Retry the command.
1 - 7
FAIL
The system may or may not continue to operate correctly. The system
may fail later when some action requires access to the corrupted area
of the Text.
may fail later when some action requires access to the corrupted area
of the Text.
1. The Flash ROM should be reprogrammed via the
upgrade
software
command. The memory card should contain the same
vintage software that is currently in the system. Refer to the
"Software Upgrade" section in this manual.
"Software Upgrade" section in this manual.
2. If the test continues to fail, replace the TN790 Processor circuit
pack and repeat step 1.
PASS
The checksum is correct.
Continued on next page