Agilent Technologies 85225F Manual Do Utilizador

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78
Installation and User’s Guide
2
Installing the System
 
Precautions for Performing Floating-Ground Measurements
IC- CAP measurements can be performed with the device in a 
floating- ground configuration. This prevents ground- loop noise and, in the 
case of a bipolar junction transistor, damage to the device under test. 
A floating- ground configuration is created by removing the shorting bar 
that connects the CIRCUIT COMMON and CHASSIS GROUND terminals.
If you are making measurements in a floating- ground configuration, ensure 
that the shorting bar is disconnected
 between the CIRCUIT COMMON and 
CHASSIS GROUND terminals.
To perform floating-ground measurements 
When floating ground measurements are necessary, remove the rear front 
panel shorting bar connecting the CIRCUIT COMMON and CHASSIS 
GROUND terminals. 
When the shorting bar is removed, you must drive the DUT circuit 
common with either an SMU, GNDU, or by connecting directly to the DC 
subsystem circuit common. The circuit common can be found at the DUT 
ends of the SMU and GNDU cables.
Read 
page 78, then follow these steps to connect the CIRCUIT COMMON to an 
external ground.
WA R N I N G
A potential shock hazard exists when the shorting bar is disconnected for 
floating-ground measurements. Do not touch any of the DC subsystem rear 
panel connectors while a floating ground measurement is in progress.
N O T E
The circuit common is not connected through the bias networks.
To connect an external ground to the circuit common
Step
Remove the shorting bar connecting the CIRCUIT COMMON and CHASSIS 
GROUND terminals.
Connect the external ground to the CIRCUIT COMMON of the DC subsystem.