Toshiba F45 Manual Do Utilizador

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL. 

Percent (%): Choose the percentage of the defined range of the memory to 
be tested. 

Time Limit(h): Choose or Input the time (hour) of the defined range of the 
memory to be tested. 

Time Limit(m): Choose or Input the time (minute) of the defined range of 
the memory to be tested. 

1.  Bit Stuck High Test 

Data pattern: Every bit is ‘1’ (Each bit is high) 

2.  Bit Stuck Low Test 

Data pattern: Every bit is ‘0'(Each bit is low); 

3.  Checker Board Test 

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 
(0xA); 

4.  CAS Line Test 

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 
1111(0xF); 

5.  Incremental Test 

Data pattern: A series of increasing data from 0 by adding 1 each time; 

6.  Decrement Test 

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by 
subtracting 1 each time; 

7.  Incremental / Decrement Test 

Data Pattern is a series of data whose low byte is increasing data from 0x00 
and high byte is decreasing data from 0xFF. 

In addition to the above pattern test of the memory, there is Read/Write Cycle test 

and Read Cycle Test for the extended memory. 

Below is the parameter dialog window of the extended pattern test. 

QosmioF40/F45，dynabook Qosmio F40  Maintenance Manual