Intel D525 AU80610006225AA Manual Do Utilizador

Códigos do produto

AU80610006225AA

Thermal Specifications and Design Considerations

Datasheet

location on the die, and time based variations in the die temperature measurement.
Time based variations can occur when the sampling rate of the thermal diode (by the
thermal sensor) is slower than the rate at which the T

temperature can change.

Offset between the thermal diode based temperature reading and the Intel Thermal
Monitor reading may be characterized using the Intel Thermal Monitor’s Automatic
mode activation of the thermal control circuit. This temperature offset must be taken
into account when using the processor thermal diode to implement power management
events. This offset is different than the diode T

offset

value programmed into the

processor Model Specific Register (MSR).

Table 7-47

and

Table 7-48

provide the diode interface and specifications. Transistor

model parameters shown in

Table 7-48

providing more accurate temperature

measurements when the diode ideality factor is closer to the maximum or minimum
limits. Contact your external sensor supplier for their recommendation. The thermal
diode is separate from the Thermal Monitor’s thermal sensor and cannot be used to
predict the behavior of the Thermal Monitor.

NOTES:
1.

Intel does not support or recommend operation of the thermal diode under reverse bias.

Characterized across a temperature range of 50–100°C.

Not 100% tested. Specified by design characterization.

The ideality factor, nQ, represents the deviation from ideal transistor model behavior as
exemplified by the equation for the collector current:

= I

* (e

–1)

where I

= saturation current, q = electronic charge, V

= voltage across the transistor

base emitter junction (same nodes as VD), k = Boltzmann Constant, and T = absolute

temperature (Kelvin).

The series resistance, R

, provided in the Diode Model Table (

Table 7-48

) can be used for