Microchip Technology MCP4018T-104E/LT Linear IC SC-70-6 MCP4018T-104E/LT Ficha De Dados

© 2009 Microchip Technology Inc.

DS22147A-page 3

Voltage on V

DD

 with respect to V

SS

.....  -0.6V to +7.0V

Voltage on SCL, and SDA with respect to V

SS

 

.............................................................................  

-0.6V to 12.5V

Voltage on all other pins (A, W, and B) 
with respect to V

SS

 

............................ 

-0.3V to V

DD

 + 0.3V

Input clamp current, I

IK

 

(V

I

 < 0, V

I

 > V

DD

, V

I

 > V

PP

 

ON

 HV pins) ........... ±20 mA

Output clamp current, I

OK

 

(V

O

 < 0 or V

O

 > V

DD

) ....................................... ±20 mA

Maximum output current sunk by any Output pin 

........................................................................... 25 mA

Maximum output current sourced by any Output pin 

........................................................................... 25 mA

Maximum current out of V

SS

 pin ...................... 100 mA

Maximum current into V

DD

 pin ......................... 100 mA

Maximum current into A, W and B pins........... ±2.5 mA
Package power dissipation (T

A

 = +50°C, T

J

 = +150°C)

SC70-5............................................................ 302 mW
SC70-6.................................................................. TBD
Storage temperature .......................... -65°C to +150°C
Ambient temperature with power applied 

........................................................... -40°C to +125°C

ESD protection on all pins 

........................≥ 4 kV (HBM)

........................................................................≥ 400V (MM)

Maximum Junction Temperature (T

J

) .............. +150°C

† Notice: Stresses above those listed under “Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of
the device at those or any other conditions above those
indicated in the operational listings of this specification
is not implied. Exposure to maximum rating conditions
for extended periods may affect device reliability.