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Electrical Specifications
Intel
®
 Xeon
®
 and Intel
®
 Core™ Processors For Communications Infrastructure
Datasheet - Volume 1 of 2
May 2012
102
Document Number: 327405
-
001
Table 9-14. Differential Clocks (SSC on)
SSC ON
1CLK
μs
0.1 s
0.1 s
μs
1CLK
Signal 
Name
-Jitter c-c 
Abs
PerMin
-SSC Short
AvgMin
-ppm Long
AvgMin
Ideal DC 
Target
+ppm 
Long
AvgMax
+SSC 
Short
AvgMax
+Jitter c-c 
Abs
PerMax
Units
BCLK
9.849063
9.999063
10.02406
10.02506
10.02607
10.05120
10.20120
ns
Notes:
1.
Ideal DC Target: This serves only as an ideal reference target (0 ppm) to use for calculating the rest of the period 
measurement values
2.
0.1-second Measurement Window (frequency counter): Valuable measurement done using a frequency counter to 
determine near DC average frequency (filtering out all jitter including SSC and cycle to cycle). This is used to determine 
if the system has a frequency static offset caused usually by incorrect crystal, crystal loading or incorrect clock 
configuration.
3.
1.0-μs Measurement Window (scope): This measurement is only used in conjunction with clock post processing software 
(Jit3 Advanced for example) with “filters = LPF 3RD order 1-MHz pole” to filter out high frequency jitter (FM) and show 
the underlying SSC profile. The numbers here bound the SSC min/ max excursions (SSC magnitude).
4.
1CLK - No Filter: Any 1 Period measured with a scope. Measured on a real time Oscilloscope using no filters, a simple 
period measurement (or a Jit3 period measurement - more accurate), provides absolute Min/Max timing information.
Table 9-15. Differential Clocks (SSC off)
SSC OFF
1CLK
0.1s
0.1s
1CLK
Signal Name
-Jitter c-c 
AbsPerMin
-ppm 
LongAvgMin
Ideal DC 
target
+ppm 
LongAvgMax
+Jitter c-c 
AbsPerMax
Units
BCLK
9.849000
9.999000
10.00000
10.00100
10.15100
ns
Notes:
1.
Ideal DC Target: This serves only as an ideal reference target (0ppm) to use for calculating the rest of the period 
measurement values
2.
0.1-second Measurement Window (frequency counter): Valuable measurement done using a frequency counter to 
determine near DC average frequency (filtering out all jitter including SSC and cycle to cycle). This is used to determine 
if the system has a frequency static offset caused usually by incorrect crystal, crystal loading or incorrect clock 
configuration.
3.
1CLK - No Filter: Any 1 Period measured with a scope. Measured on a real time Oscilloscope using no filters, a simple 
period measurement (or a Jit3 period measurement - more accurate), provides absolute Min / Max timing information.
Table 9-16. Processor Clock Jitter Specifications (cycle-cycle)
Symbol
Frequency
(MHz)
Type
Source
(ps)
Destination
Notes
BCLK
JIT_CC
100
Input Diff
150
processor/memory/PCI Express*
1
Notes:
1.
On all jitter measurements care should be taken to set the zero crossing voltage (for rising edge) of the clock to be the 
point where the edge rate is the fastest. Using a Math function = Average (Derivative (Ch1)) and set the averages to 64, 
place the cursors where the slope is the highest on the rising edge - usually the lower half of the rising edge. This is 
defined because Flip Chip components prevent probing at the end of the transmission line. This will result in a reflection 
induced ledge in the middle of the rising edge and will significantly increase measured jitter.
Table 9-17. System Reference Clock DC and AC Specifications
Symbol
Parameter
Signal
Min
Max
Unit
Meas
Figure
Notes
Slew_rise
Rising Slew Rate
Diff
1.5
4.0
V/ns
Avg
2,3
Slew_fall
Falling Slew Rate
Diff
1.5
4.0
V/ns
Avg
2,3
Slew_var
Slew Rate Matching
Single Ended
20
%
Avg
1,9
V
SWING
Differential Output Swing
Diff
300
mV
RT
2