Справочник Пользователя для Intel III Xeon 733 MHz 80526KZ733256
Модели
80526KZ733256
ELECTRICAL SPECIFICATIONS
18
A Debug Port is described in Chapter 8. The Debug Port must be placed at the start and end of the TAP chain with TDI to
the first component coming from the Debug Port and TDO from the last component going to the Debug Port. In an MP
system, be cautious when including an empty SC330 connector in the scan chain. All connectors in the scan chain must
have a processor or termination card installed to complete the chain between TDI and TDO or the system must support a
method to bypass the empty connectors. SC330 terminator substrates should tie TDI directly to TDO. (See Chapter 8 for
more details.)
the first component coming from the Debug Port and TDO from the last component going to the Debug Port. In an MP
system, be cautious when including an empty SC330 connector in the scan chain. All connectors in the scan chain must
have a processor or termination card installed to complete the chain between TDI and TDO or the system must support a
method to bypass the empty connectors. SC330 terminator substrates should tie TDI directly to TDO. (See Chapter 8 for
more details.)
3.9 Maximum Ratings
Functional operation at the absolute maximum and minimum is not implied nor guaranteed. The processor should not
receive a clock while subjected to these conditions. Functional operating conditions are given in the AC and DC tables.
Extended exposure to the maximum ratings may affect device reliability. Furthermore, although the processor contains
protective circuitry to resist damage from static electric discharge, one should always take precautions to avoid high static
voltages or electric fields.
receive a clock while subjected to these conditions. Functional operating conditions are given in the AC and DC tables.
Extended exposure to the maximum ratings may affect device reliability. Furthermore, although the processor contains
protective circuitry to resist damage from static electric discharge, one should always take precautions to avoid high static
voltages or electric fields.
Table 4. Absolute Maximum Ratings
Symbol Parameter
Min Max
Unit
Notes
T
STORAGE
Processor storage temperature
–40
85
°C
3
VCC_CORE
Supply voltage with respect to
V
V
SS
seen at the input of the
OCVR
–0.5 Operating
voltage + 1.0
V 1,2
V
SMBus
Any
processor
SM
supply
voltage with respect to V
SS
-0.3 Operating
voltage + 1.0
V
V
CCTAP
Any processor TAP supply
voltage with respect to V
voltage with respect to V
SS
-0.3 3.3
V
1
V
inGTL
AGTL+ buffer DC input voltage
with respect to V
with respect to V
SS
–0.3 +
1.65
V
V
inCMOS
CMOS & APIC buffer DC input
voltage with respect to V
voltage with respect to V
SS
–0.3 3.3
V
V
inSMBus
SMBus buffer DC input voltage
with respect to V
with respect to V
SS
-0.1 7.0
V
I
PWR_EN
Max PWR_EN[1:0] pin current
100
mA
NOTES:
1.
Operating voltage is the voltage to which the component is designed to operate. See Table 5.
2.
VCC_CORE
is the voltage input seen at the input of the OCVR device which may be 2.8V for one product version or 5V (or 12V) for
another product version.
3.
Please contact Intel® for storage requirements in excess of one year.
3.10
Processor
DC
Specifications
The voltage and current specifications provided in Table 5 and Table 6 are defined at the processor edge fingers. The
processor signal DC specifications in Tables 7, 8 and 9 are defined at the processor core. Each signal trace between the
processor edge finger and the processor core carries a small amount of current and has a finite resistance. The current
produces a voltage drop between the processor edge finger and the core. Simulations should therefore be run versus
these specifications to the processor core.
See Chapter 1 for the processor edge finger signal definitions and Table 3 for the signal grouping.
Most of the signals on the processor system bus are in the AGTL+ signal group. These signals are specified to be
terminated to VTT. The DC specifications for these signals are listed in Table 7.
To ease connection with other devices, the Clock, CMOS, APIC, SMBus and TAP signals are designed to interface at
non-AGTL+ levels. The processor contains a voltage clamp device on the cartridge substrate between the core and edge
fingers. This device “clamps” the 2.5V level CMOS, TAP, and APIC signals to 1.5V levels, which helps reduce overshoot
levels at the processor core. All CMOS, TAP, Clock, and APIC signals interface with the voltage clamp, with the
processor signal DC specifications in Tables 7, 8 and 9 are defined at the processor core. Each signal trace between the
processor edge finger and the processor core carries a small amount of current and has a finite resistance. The current
produces a voltage drop between the processor edge finger and the core. Simulations should therefore be run versus
these specifications to the processor core.
See Chapter 1 for the processor edge finger signal definitions and Table 3 for the signal grouping.
Most of the signals on the processor system bus are in the AGTL+ signal group. These signals are specified to be
terminated to VTT. The DC specifications for these signals are listed in Table 7.
To ease connection with other devices, the Clock, CMOS, APIC, SMBus and TAP signals are designed to interface at
non-AGTL+ levels. The processor contains a voltage clamp device on the cartridge substrate between the core and edge
fingers. This device “clamps” the 2.5V level CMOS, TAP, and APIC signals to 1.5V levels, which helps reduce overshoot
levels at the processor core. All CMOS, TAP, Clock, and APIC signals interface with the voltage clamp, with the
exception of BCLK, PICCLK and PWRGOOD
.
The DC specifications for these pins are listed in Table 8 and Table 9
.