Справочник Пользователя для Benning IT 120 B 044102

32

Trip-out time measurement is used to verify the effectiveness of the RCD. This is achieved by a 
test simulating an appropriate fault condition. Trip-out times vary between standards and are listed 
below.

Trip-out times according to EN 61008 / EN 61009:

½

×I

∆N

*)

I

∆N

2

×I

∆N

5

×I

∆N

General (non-
delayed) RCDs

t

∆ 

< 300 ms

t

∆ 

< 300 ms

t

∆

 < 150 ms

t

∆

 < 40 ms

Selective (time-
delayed) RCDs

t

∆ 

< 500 ms

130 ms < t

∆ 

< 

500 ms

60 ms < t

∆

 < 

200 ms

50 ms < t

∆

 < 

150 ms

Trip-out times according to IEC 60364-4-41:

½

×I

∆N

*)

I

∆N

2

×I

∆N

5

×I

∆N

General (non-
delayed) RCDs

t

∆ 

< 999 ms

t

∆ 

< 999 ms

t

∆

 < 150 ms

t

∆

 < 40 ms

Selective (time-
delayed) RCDs

t

∆ 

< 999 ms

130 ms < t

∆ 

< 

999 ms

60 ms < t

∆

 < 

200 ms

50 ms < t

∆

 < 

150 ms

Trip-out times according to BS 7671:

½

×I

∆N

*)

I

∆N

2

×I

∆N

5

×I

∆N

General (non-
delayed) RCDs

t

∆ 

< 1999 ms

t

∆ 

< 300 ms

t

∆

 < 150 ms

t

∆

 < 40 ms

Selective (time-
delayed) RCDs

t

∆ 

< 1999 ms

130 ms < t

∆ 

< 500 

ms

60 ms < t

∆

 < 

200 ms

50 ms < t

∆

 < 

150 ms

*) Test current of ½

×I

∆N

 cannot cause trip-out of the RCDs. 

How to perform trip-out time measurement:
Step 1 

 Select FI/ RCD TEST (RCD) with the function selector switch. Use the 

/

. keys to se-

lect RCDt (trip-out time of the RCD). The following menu is displayed:

 

 

Connect the test cable to the BENNING IT 110/ BENNING IT 120 B.

Step 2 

Set the following measuring parameters:

 

 

- 

 Nominal differential trip-out current

 

 

- 

 Nominal differential trip-out current multiplier

 

 

- 

 RCD type, and

 

 

- 

 Test current starting polarity