Nxp Semiconductors UM10237 用户手册

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页码 792
UM10237_2
© NXP B.V. 2008. All rights reserved.
User manual
Rev. 02 — 19 December 2008 
6 of 792
NXP Semiconductors
UM10237
Chapter 1: LPC24XX Introductory information
Boundary scan for simplified board testing.
Versatile pin function selections allow more possibilities for using on-chip peripheral 
functions.
4.
Applications
Industrial control
Medical systems
Protocol converter
Communications
5.
Ordering options
5.1 LPC2458 ordering options
 
 
5.2 LPC2460 ordering options
 
Table 3.
LPC2458 ordering information
Type number
Package 
Name
Description
Version
LPC2458FET180
TFBGA180 plastic thin fine-pitch ball grid array package; 180 balls; body 12 x 12 x 0.8 mm SOT570-2
Table 4.
LPC2458 ordering options
Type number
Flash 
(kB)
SRAM (kB)
External 
bus
Ethernet
USB 
OTG/ 
OHC/ 
DEV 
+ 4 kB 
FIFO
CAN channels
SD/
MMC
GP 
DMA
ADC channels
DAC channels
Temp 
range
Lo
cal
 bu
s
Et
hernet buffer
GP/
U
SB
RTC
To
ta
l
LPC2458FET180
512
64 16 16 2
98 16-bit
MII/
RMII
yes
2 yes
yes
8
1
−40 °C to 
+85
°C
Table 5.
LPC2420/60 ordering information
Type number
Package 
Name
Description
Version
LPC2420FBD208 LQFP208
plastic low profile quad flat package; 208 leads; body 28 
× 28 × 1.4 mm
SOT459-1
LPC2460FBD208 LQFP208
plastic low profile quad flat package; 208 leads; body 28 
× 28 × 1.4 mm
SOT459-1
LPC2460FET208
TFBGA208 plastic thin fine-pitch ball grid array package; 208 balls; body 15 
× 15 × 0.7 mm SOT950-1