mitutoyo 501s 用户手册

 

In a DF-type setup shown below, a workpiece of a larger diameter can be measured by 

measuring the gap between two measuring units 1 and 2 and referring to the 
predetermined offset value of the reference gage. 

 

(1) Improvement of the measurement accuracy 

・ 

To ensure better measuring accuracy of gap measurement, use reference pins or 
knife-edges as located at the focal point. 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

・ 

The reference pin will help reduce the effect of possible fluctuation of the emission 
unit being subject to a force. 
In a setup without reference pins, the fluctuation of the emission unit due to some 
external force will produce a significant difference between the measurements B 
and B’ as shown in (c) and (d) below. 

 

   

 

 
 
 
 

   

 

Reference pins

 

(b) Example of setup for facing of two 

units  Segment (1 + 5)

 

(a) Example of setup for stack of two 

units  Segment (1 + 5)

 

Measuring 

unit 2

Measuring 

unit 2

 

Measuring 

unit 1

Measuring 

unit 1

 

(a) Initial state incorporated with 

reference pins

 

(b) Effect of fluctuation of the 

emission unit in a setup 
incorporating reference 
pins

 

A

Difference of A and A’ : Small

 

A ’

B ’

B  

Difference of B and B’ : Large 

 

 

 

(c)

 

Initial state without 

reference pins 

(d) Effect of fluctuation of the 

emission unit in a setup 
without reference pins.