Texas Instruments IC MCU 16B MSP430F2002IRSAT VQFN-16 TID MSP430F2002IRSAT 数据表
产品代码
MSP430F2002IRSAT
MSP430F20x3
MSP430F20x2
MSP430F20x1
MSP430F20x2
MSP430F20x1
SLAS491I – AUGUST 2005 – REVISED DECEMBER 2012
Table 4. Terminal Functions, MSP430F20x3
TERMINAL
NO.
DESCRIPTION
NAME
I/O
PW, N
RSA
General-purpose digital I/O pin
Timer_A, clock signal TACLK input
Timer_A, clock signal TACLK input
P1.0/TACLK/ACLK/A0+
2
1
I/O
ACLK signal output
SD16_A positive analog input A0
SD16_A positive analog input A0
General-purpose digital I/O pin
Timer_A, capture: CCI0A input, compare: Out0 output
Timer_A, capture: CCI0A input, compare: Out0 output
P1.1/TA0/A0-/A4+
3
2
I/O
SD16_A negative analog input A0
SD16_A positive analog input A4
SD16_A positive analog input A4
General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: Out1 output
Timer_A, capture: CCI1A input, compare: Out1 output
P1.2/TA1/A1+/A4-
4
3
I/O
SD16_A positive analog input A1
SD16_A negative analog input A4
SD16_A negative analog input A4
General-purpose digital I/O pin
Input for an external reference voltage/internal reference voltage output (can be
Input for an external reference voltage/internal reference voltage output (can be
P1.3/VREF/A1-
5
4
I/O
used as mid-voltage)
SD16_A negative analog input A1
SD16_A negative analog input A1
General-purpose digital I/O pin
SMCLK signal output
SMCLK signal output
P1.4/SMCLK/A2+/TCK
6
5
I/O
SD16_A positive analog input A2
JTAG test clock, input terminal for device programming and test
JTAG test clock, input terminal for device programming and test
General-purpose digital I/O pin
Timer_A, compare: Out0 output
Timer_A, compare: Out0 output
P1.5/TA0/A2-/SCLK/TMS
7
6
I/O
SD16_A negative analog input A2
USI: external clock input in SPI or I2C mode; clock output in SPI mode
JTAG test mode select, input terminal for device programming and test
USI: external clock input in SPI or I2C mode; clock output in SPI mode
JTAG test mode select, input terminal for device programming and test
General-purpose digital I/O pin
Timer_A, capture: CCI1B input, compare: Out1 output
Timer_A, capture: CCI1B input, compare: Out1 output
P1.6/TA1/A3+/SDO/SCL/
8
7
I/O
SD16_A positive analog input A3
TDI/TCLK
USI: Data output in SPI mode; I2C clock in I2C mode
JTAG test data input or test clock input during programming and test
JTAG test data input or test clock input during programming and test
General-purpose digital I/O pin
P1.7/A3-/SDI/SDA/
SD16_A negative analog input A3
9
8
I/O
TDO/TDI
(1)
USI: Data input in SPI mode; I2C data in I2C mode
JTAG test data output terminal or test data input during programming and test
JTAG test data output terminal or test data input during programming and test
Input terminal of crystal oscillator
XIN/P2.6/TA1
13
12
I/O
General-purpose digital I/O pin
Timer_A, compare: Out1 output
Timer_A, compare: Out1 output
Output terminal of crystal oscillator
XOUT/P2.7
12
11
I/O
General-purpose digital I/O pin
(2)
Reset or nonmaskable interrupt input
RST/NMI/SBWTDIO
10
9
I
Spy-Bi-Wire test data input/output during programming and test
Selects test mode for JTAG pins on Port 1. The device protection fuse is
TEST/SBWTCK
11
10
I
connected to TEST.
Spy-Bi-Wire test clock input during programming and test
Spy-Bi-Wire test clock input during programming and test
V
CC
1
NA
Supply voltage
V
SS
14
NA
Ground reference
DV
CC
NA
16
Digital supply voltage
AV
CC
NA
15
Analog supply voltage
DV
SS
NA
14
Digital ground reference
AV
SS
NA
13
Analog ground reference
QFN Pad
NA
Pad
NA
QFN package pad. Connection to VSS is recommended.
(1)
TDO or TDI is selected via JTAG instruction.
(2)
If XOUT/P2.7 is used as an input, excess current flows until P2SEL.7 is cleared. This is due to the oscillator output driver connection to
this pad after reset.
this pad after reset.
10
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